P

Inventor

PARK JUNBUM

KR19 patents
⚠️ This page may combine multiple inventors who share the name “PARK JUNBUM”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

14 patents
US10459854B2Oct 29, 2019

Storage device including a snooper that monitors a system bus to detect completion of writing data to a buffer memory and a method thereof

SAMSUNG ELECTRONICS CO LTD5 citations82
US11755241B2Sep 12, 2023

Storage system and method for operating storage system based on buffer utilization

SAMSUNG ELECTRONICS CO LTD2 citations71
US12536108B2Jan 27, 2026

Storage device, operation method of the storage device, and electronic system including the storage device

SAMSUNG ELECTRONICS CO LTD0 citations61
US11016912B2May 25, 2021

Storage device or memory controller with first direct memory access engine configured to control writing first data into buffer memory and second direct memory access engine configured to control transmitting written first data to external host device

SAMSUNG ELECTRONICS CO LTD1 citations61
US11680898B2Jun 20, 2023

Hybrid probe, physical property analysis apparatus including the same, and method of measuring semiconductor device using the apparatus

SAMSUNG ELECTRONICS CO LTD0 citations60
US12469750B2Nov 11, 2025

Method of extracting properties of a layer on a wafer

SAMSUNG ELECTRONICS CO LTD0 citations58
US12165933B2Dec 10, 2024

Semiconductor substrate processing apparatus and semiconductor substrate measuring apparatus using the same

SAMSUNG ELECTRONICS CO LTD1 citations58
US11579168B2Feb 14, 2023

Probe for detecting near field and near-field detecting system including the same

SAMSUNG ELECTRONICS CO LTD0 citations58
US11946881B2Apr 2, 2024

Inspection apparatus and inspection method using same

SAMSUNG ELECTRONICS CO LTD0 citations56
US12474393B2Nov 18, 2025

Terahertz probe

SAMSUNG ELECTRONICS CO LTD0 citations55
US11579167B2Feb 14, 2023

Probe for detecting near field and near-field detection system including the same

SAMSUNG ELECTRONICS CO LTD0 citations54
US11488875B2Nov 1, 2022

Semiconductor substrate measuring apparatus and plasma treatment apparatus using the same

SAMSUNG ELECTRONICS CO LTD0 citations49
US12555757B2Feb 17, 2026

Semiconductor equipment monitoring apparatus, and semiconductor equipment including the semiconductor equipment monitoring apparatus

SAMSUNG ELECTRONICS CO LTD0 citations47
US10871396B2Dec 22, 2020

Optical emission spectroscopy calibration device and system including the same

SAMSUNG ELECTRONICS CO LTD0 citations41

LG ELECTRONICS INC

4 patents

SHIN JEONGEUN

1 patent