Inventor
MILLER GABRIEL L
US28 patents
⚠️ This page may combine multiple inventors who share the name “MILLER GABRIEL L”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
AT & T BELL LAB
11 patentsUS5245796ASep 21, 1993
Slurry polisher using ultrasonic agitation
AT & T BELL LAB172 citations98
US5081421AJan 14, 1992
In situ monitoring technique and apparatus for chemical/mechanical planarization endpoint detection
AT & T BELL LAB300 citations98
US4526043AJul 2, 1985
Conformable tactile sensor
AT & T BELL LAB285 citations98
US5337353AAug 9, 1994
Capacitive proximity sensors
AT & T BELL LAB134 citations97
US5323053AJun 21, 1994
Semiconductor devices using epitaxial silicides on (111) surfaces etched in (100) silicon substrates
AT & T BELL LAB97 citations96
US4958115ASep 18, 1990
Capacitively commutated brushless DC servomotors
AT & T BELL LAB55 citations96
US5307693AMay 3, 1994
Force-sensing system, including a magnetically mounted rocking element
AT & T BELL LAB48 citations92
US5085070AFeb 4, 1992
Capacitive force-balance system for measuring small forces and pressures
AT & T BELL LAB31 citations92
US4597068AJun 24, 1986
Acoustic ranging system
AT & T BELL LAB12 citations74
US4551674ANov 5, 1985
Noncontacting conductivity type determination and surface state spectroscopy of semiconductor materials
AT & T BELL LAB17 citations74
US5072179ADec 10, 1991
High resolution one and two dimensional position indicating apparatus with plural windings having a common connection and separately energized by signals of different phase
AT & T BELL LAB15 citations73
BELL TELEPHONE LABOR INC
7 patentsUS4286215AAug 25, 1981
Method and apparatus for the contactless monitoring carrier lifetime in semiconductor materials
BELL TELEPHONE LABOR INC69 citations96
US4240843ADec 23, 1980
Forming self-guarded p-n junctions by epitaxial regrowth of amorphous regions using selective radiation annealing
BELL TELEPHONE LABOR INC36 citations92
US4208624AJun 17, 1980
Method and apparatus for investigating dielectric semiconductor materials
BELL TELEPHONE LABOR INC20 citations82
US4190799AFeb 26, 1980
Noncontacting measurement of hall effect in a wafer
BELL TELEPHONE LABOR INC28 citations76
US4227147AOct 7, 1980
Electromechanical parametric amplifier for measurement of electric fields
BELL TELEPHONE LABOR INC15 citations74
US4203781AMay 20, 1980
Laser deformation of semiconductor junctions
BELL TELEPHONE LABOR INC15 citations74
US4213087AJul 15, 1980
Method and device for testing electrical conductor elements
BELL TELEPHONE LABOR INC8 citations66
AT & T CORP
5 patentsUS5481104AJan 2, 1996
Photodetector circuit with actively damped tuned input
AT & T CORP22 citations92
US5480529AJan 2, 1996
Apparatus for depositing low stress films
AT & T CORP7 citations72
US5444777AAug 22, 1995
Battery feed for telephone line cards
AT & T CORP13 citations72
US5382340AJan 17, 1995
Process for reduced stress tungsten deposition
AT & T CORP8 citations72
US5517012AMay 14, 1996
Optical scanner
AT & T CORP1 citations51
LUCENT TECHNOLOGIES INC
3 patentsUS5701133ADec 23, 1997
Cascaded multiplying current mirror driver for LED's
LUCENT TECHNOLOGIES INC26 citations92
US5756887AMay 26, 1998
Mechanism for changing a probe balance beam in a scanning probe microscope
LUCENT TECHNOLOGIES INC18 citations83
US5620573AApr 15, 1997
Reduced stress tungsten deposition
LUCENT TECHNOLOGIES INC2 citations61