Inventor
OMOTO KAZUYA
JP4 patents
Patents
4 patentsUS10541111B2Jan 21, 2020
Distortion measurement method for electron microscope image, electron microscope, distortion measurement specimen, and method of manufacturing distortion measurement specimen
JEOL LTD1 citations58
US11043353B2Jun 22, 2021
Energy filter and charged particle beam apparatus
JEOL LTD1 citations54
US10546714B2Jan 28, 2020
Energy filter and charged particle beam system
JEOL LTD0 citations33
US9018581B2Apr 28, 2015
Transmission electron microscope
JEOL LTD0 citations33