Inventor
WEBER LARREN GENE
US26 patents
⚠️ This page may combine multiple inventors who share the name “WEBER LARREN GENE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MICRON TECHNOLOGY INC
25 patentsUS7180386B2Feb 20, 2007
Variable resistance circuit
MICRON TECHNOLOGY INC15 citations92
US6958661B2Oct 25, 2005
Variable resistance circuit
MICRON TECHNOLOGY INC15 citations92
US6545560B1Apr 8, 2003
Method to find a value within a range using weighted subranges
MICRON TECHNOLOGY INC16 citations92
US6516363B1Feb 4, 2003
Output data path having selectable data rates
MICRON TECHNOLOGY INC20 citations92
US6445259B1Sep 3, 2002
Method to find a value within a range using weighted subranges
MICRON TECHNOLOGY INC17 citations92
US6009249ADec 28, 1999
Automated load determination for partitioned simulation
MICRON TECHNOLOGY INC17 citations92
US5808896ASep 15, 1998
Method and system for creating a netlist allowing current measurement through a sub-circuit
MICRON TECHNOLOGY INC28 citations92
US5946218AAug 31, 1999
System and method for changing the connected behavior of a circuit design schematic
MICRON TECHNOLOGY INC33 citations91
US5901064AMay 4, 1999
System and method for scoping global nets in a hierarchical netlist
MICRON TECHNOLOGY INC26 citations91
US5815402ASep 29, 1998
System and method for changing the connected behavior of a circuit design schematic
MICRON TECHNOLOGY INC38 citations91
US6657512B2Dec 2, 2003
Method to find a value within a range using weighted subranges
MICRON TECHNOLOGY INC10 citations82
US6545561B2Apr 8, 2003
Method to find a value within a range using weighted subranges
MICRON TECHNOLOGY INC8 citations82
US6469591B2Oct 22, 2002
Method to find a value within a range using weighted subranges
MICRON TECHNOLOGY INC8 citations82
US6384714B2May 7, 2002
Method to find a value within a range using weighted subranges
MICRON TECHNOLOGY INC8 citations82
US7171642B2Jan 30, 2007
Method and system for creating a netlist allowing current measurement through a sub-circuit
MICRON TECHNOLOGY INC6 citations74
US7149986B2Dec 12, 2006
Automated load determination for partitioned simulation
MICRON TECHNOLOGY INC5 citations74
US6823407B2Nov 23, 2004
Output data path capable of multiple data rates
MICRON TECHNOLOGY INC7 citations74
US6556095B2Apr 29, 2003
Method to find a value within a range using weighted subranges
MICRON TECHNOLOGY INC6 citations74
US6275119B1Aug 14, 2001
Method to find a value within a range using weighted subranges
MICRON TECHNOLOGY INC4 citations74
US6230301B1May 8, 2001
Method and system for creating a netlist allowing current measurement through a subcircuit
MICRON TECHNOLOGY INC9 citations74
US6189134B1Feb 13, 2001
System and method for scoping global nets in a flat netlist
MICRON TECHNOLOGY INC7 citations74
US5875115AFeb 23, 1999
System and method for scoping global nets in a flat netlist
MICRON TECHNOLOGY INC14 citations74
US6091079AJul 18, 2000
Semiconductor wafer
MICRON TECHNOLOGY INC11 citations72
US6553543B1Apr 22, 2003
Automated load determination for partitioned simulation
MICRON TECHNOLOGY INC2 citations63
US6865628B2Mar 8, 2005
Output data path capable of multiple data rates
MICRON TECHNOLOGY INC0 citations52