Inventor
ROUSEY JAMES E
US3 patents
Patents
3 patentsUS5422892AJun 6, 1995
Integrated circuit test arrangement and method for maximizing the use of tester comparator circuitry to economically test wide data I/O memory devices
TEXAS INSTRUMENTS INC40 citations90
US7323899B2Jan 29, 2008
System and method for resumed probing of a wafer
TEXAS INSTRUMENTS INC38 citations87
US7148716B2Dec 12, 2006
System and method for the probing of a wafer
TEXAS INSTRUMENTS INC10 citations68