Inventor
SATOU TETSUYA
JP21 patents
⚠️ This page may combine multiple inventors who share the name “SATOU TETSUYA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD
8 patentsUS6998775B2Feb 14, 2006
Layered, light-emitting element
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD33 citations92
US6391482B1May 21, 2002
Organic material for electroluminescent device and electroluminescent device using the same
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD52 citations92
US7083863B2Aug 1, 2006
Luminous element and method for preparation thereof
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD13 citations84
US7342246B2Mar 11, 2008
Light-emitting element and display device and lighting device using same
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD12 citations83
US6617613B2Sep 9, 2003
Array of light emitting devices with extended lifetime and high luminescence
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD16 citations83
US6682832B2Jan 27, 2004
Thin film el device
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD9 citations71
US6849346B2Feb 1, 2005
Electrode and thin film EL device including the same and methods of fabricating the same and display device and lighting system including the thin film EL device
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD4 citations61
US6989201B2Jan 24, 2006
Thin film EL device
MATSUSHITA ELECTRIC INDUSTRIAL CO LTD0 citations50
NIPPON OXYGEN CO LTD
5 patentsUS6523567B2Feb 25, 2003
Apparatus and process for supplying gas
NIPPON OXYGEN CO LTD20 citations83
US6478040B1Nov 12, 2002
Gas supplying apparatus and gas substitution method
NIPPON OXYGEN CO LTD9 citations73
US6474136B1Nov 5, 2002
Method and apparatus for analyzing impurities in gases
NIPPON OXYGEN CO LTD10 citations73
US6717666B2Apr 6, 2004
Method and apparatus for measuring nitrogen in a gas
NIPPON OXYGEN CO LTD8 citations72
US6653144B1Nov 25, 2003
Method and an apparatus for analyzing trace impurities in gases
NIPPON OXYGEN CO LTD2 citations62