Inventor

SHINDO HIROYUKI

JP73 patents

⚠️ This page may combine multiple inventors who share the name “SHINDO HIROYUKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SHINDO HIROYUKI

HITACHI HIGH TECH CORP

Pattern displacement measuring method and pattern measuring device

Pattern inspecting and measuring device and program

Pattern inspection system

Pattern matching method and computer program for executing pattern matching

Image evaluation method and image evaluation device

Pattern sensing device and semiconductor sensing system

Pattern inspection system

Pattern-measuring apparatus and semiconductor-measuring system

Pattern matching method and pattern matching program

Image processing system and computer program for performing image processing

Image processing system and computer program for performing image processing

Image recognition device and method

Pattern-measuring apparatus and semiconductor-measuring system

Image processing program, image processing device, and image processing method

Inspection apparatus and measurement apparatus

Defect inspection with images of different synthesis ratios

Pattern height information correction system and pattern height information correction method

Pattern inspection/measurement device, and pattern inspection/measurement program

SEIKO EPSON CORP

Head-mounted virtual image display device having switching means enabling user to select eye to view image

Screen

Screen

Illumination device and projector

Illuminator and projector

Projector including a turn table for shifting a lens barrel

Projector

Virtual vision display

SANYO ELECTRIC CO

Photodetector and optical pickup apparatus

Optical pick apparatus

Optical pickup apparatus

Photodetector and optical pickup apparatus

Lens driving apparatus and optical pickup unit having the same

KONICA MINOLTA INC

Scanning optical system and radar

Method and apparatus for manufacturing organic electroluminescent element, and organic electroluminescent module

Scanning optical system and radar

Method for forming pattern of organic electroluminescent element

TEAC CORP

Optical pickup device for detecting a tracking error of a main spot on an optical disk

Low profile optical pickup unit for recording/reproducing device

Optical pick-up device

SUGIYAMA AKIYUKI

System and method of image processing, and scanning electron microscope

System and method of image processing, and scanning electron microscope

SHIBAHARA TAKUMA

Pattern measuring apparatus, and pattern measuring method and program

Pattern measurement device and pattern measurement method

NGK INSULATORS LTD

Inspection apparatus for sensor element, and method for inspecting electrical characteristics of sensor element

Measuring equipment and method for forming laminated body

SHINDO HIROYUKI

Honeycomb segment with spacer and honeycomb structure

Honeycomb segment-forming die and method for manufacturing honeycomb structure

SUTANI TAKUMICHI

Pattern displacement measuring method and pattern measuring device

ABE YUICHI

Image processing device and computer program

ARAKAWA OSAMU

Screen and projection system

AKAO TAKAYOSHI

Apparatus for inspecting defects of honeycomb structure