P

Inventor

OLSCHEWSKI FRANK

DE17 patents
⚠️ This page may combine multiple inventors who share the name “OLSCHEWSKI FRANK”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

LEICA MICROSYSTEMS

15 patents
US7015906B2Mar 21, 2006

Method and arrangement for imaging and measuring microscopic three-dimensional structures

LEICA MICROSYSTEMS32 citations88
US7394482B2Jul 1, 2008

Microscope system and method for the analysis and evaluation of multiple colorings of a microscopic specimen

LEICA MICROSYSTEMS14 citations83
US7319520B2Jan 15, 2008

Method for separating fluorescence spectra of dyes present in a sample

LEICA MICROSYSTEMS12 citations83
US7280203B2Oct 9, 2007

Method for setting a fluorescence spectrum measurement system for microscopy

LEICA MICROSYSTEMS11 citations83
US7257289B2Aug 14, 2007

Spectral microscope and method for data acquisition using a spectral microscope

LEICA MICROSYSTEMS15 citations83
US7218762B2May 15, 2007

Method for user training for a scanning microscope, scanning microscope, and software program for user training for a scanning microscope

LEICA MICROSYSTEMS12 citations83
US7006675B2Feb 28, 2006

Method and arrangement for controlling analytical and adjustment operations of a microscope and software program

LEICA MICROSYSTEMS9 citations73
US8014624B2Sep 6, 2011

Method, arrangement, and software for optimizing the image quality of movable subjects imaged with a microscope

LEICA MICROSYSTEMS3 citations62
US7649682B2Jan 19, 2010

Method for self-monitoring a microscope system, microscope system, and software for self-monitoring a microscope system

LEICA MICROSYSTEMS6 citations62
US7471817B2Dec 30, 2008

Method for performing interactions on microscopic subjects that change in space and time, and system therefor

LEICA MICROSYSTEMS3 citations62
US7282724B2Oct 16, 2007

Method and system for the analysis of co-localizations

LEICA MICROSYSTEMS3 citations62
US7221784B2May 22, 2007

Method and arrangement for microscopy

LEICA MICROSYSTEMS6 citations62
US6947861B2Sep 20, 2005

Method for time-optimized acquisition of special spectra using a scanning microscope

LEICA MICROSYSTEMS2 citations62
US6721690B2Apr 13, 2004

Microscope and method for analyzing acquired scan data

LEICA MICROSYSTEMS2 citations62
US7120281B2Oct 10, 2006

Method; microscope system and software program for the observation of dynamic processes

LEICA MICROSYSTEMS2 citations58

TICONA GMBH

1 patent

FORBERT RAINALD

1 patent