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Inventor
GAN-OR SHIRAN
IL
2 patents
Patents
2 patents
US11037286B2
Jun 15, 2021
Method of classifying defects in a semiconductor specimen and system thereof
APPLIED MATERIALS ISRAEL LTD
2 citations
67
US11321633B2
May 3, 2022
Method of classifying defects in a specimen semiconductor examination and system thereof
APPLIED MATERIALS ISRAEL LTD
0 citations
46