Inventor

BALCH BRUCE

US4 patents

⚠️ This page may combine multiple inventors who share the name “BALCH BRUCE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

IBM

2 patents

US8020138B2Sep 13, 2011

Voltage island performance/leakage screen monitor for IP characterization

IBM9 citations82

US9082875B2Jul 14, 2015

Methods for normalizing strain in semicondcutor devices and strain normalized semiconductor devices

IBM2 citations61

ARSOVSKI IGOR

1 patent

US8521500B2Aug 27, 2013

Method and device for measuring integrated circuit power supply noise and calibration of power supply noise analysis models

ARSOVSKI IGOR0 citations49

BALCH BRUCE

1 patent

US8298876B2Oct 30, 2012

Methods for normalizing strain in semiconductor devices and strain normalized semiconductor devices

BALCH BRUCE1 citations44