Inventor
MEIXNER ANNE
US3 patents
Patents
3 patentsUS6477674B1Nov 5, 2002
Method and apparatus for conducting input/output loop back tests using a local pattern generator and delay elements
INTEL CORP105 citations94
US5559745ASep 24, 1996
Static random access memory SRAM having weak write test circuit
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US7019550B2Mar 28, 2006
Leakage testing for differential signal transceiver
INTEL CORP7 citations71