Inventor
KRISHNAN ANAND T
US10 patents
Patents
10 patentsUS7212023B2May 1, 2007
System and method for accurate negative bias temperature instability characterization
TEXAS INSTRUMENTS INC17 citations90
US7218132B2May 15, 2007
System and method for accurate negative bias temperature instability characterization
TEXAS INSTRUMENTS INC12 citations81
US6709932B1Mar 23, 2004
Method for improving gate oxide integrity and interface quality in a multi-gate oxidation process
TEXAS INSTRUMENTS INC8 citations72
US7450452B2Nov 11, 2008
Method to identify or screen VMIN drift on memory cells during burn-in or operation
TEXAS INSTRUMENTS INC8 citations67
US7208380B2Apr 24, 2007
Interface improvement by stress application during oxide growth through use of backside films
TEXAS INSTRUMENTS INC4 citations62
US7737717B2Jun 15, 2010
Current-voltage-based method for evaluating thin dielectrics based on interface traps
TEXAS INSTRUMENTS INC3 citations57
US7638412B2Dec 29, 2009
Method and system for reducing charge damage in silicon-on-insulator technology
TEXAS INSTRUMENTS INC0 citations51
US7262468B2Aug 28, 2007
Method and system for reducing charge damage in silicon-on-insulator technology
TEXAS INSTRUMENTS INC1 citations51
US7071092B2Jul 4, 2006
Method of manufacturing antenna proximity lines
TEXAS INSTRUMENTS INC0 citations51
US6969902B2Nov 29, 2005
Integrated circuit having antenna proximity lines coupled to the semiconductor substrate contacts
TEXAS INSTRUMENTS INC1 citations51