Inventor

NAKAHIRA KENJI

JP20 patents

⚠️ This page may combine multiple inventors who share the name “NAKAHIRA KENJI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NAKAHIRA KENJI

NAKAHIRA KENJI

Scanning electron microscope and method for processing an image obtained by the scanning electron microscope

Scanning type charged particle beam microscope and an image processing method using the same

Charged-particle microscope device and method for inspecting sample using same

Ultrasonographic device and method for improving ultrasonographic device image quality

Scanning electron microscope and method for processing an image obtained by the scanning electron microscope

Inspection apparatus and method for producing image for inspection

Charged particle microscope device and image capturing method

Optical inspection method and optical inspection apparatus

HITACHI HIGH TECH CORP

Observation device and observation method

Method and apparatus for displaying detected defects

Electron microscope device and imaging method using same

Charged-particle-beam device, specimen-image acquisition method, and program recording medium

Method of improving quality of scanning charged particle microscope image, and scanning charged particle microscope apparatus

BAI JIE

Medical diagnostic device and method of improving image quality of medical diagnostic device

Charged particle beam device and a method of improving image quality of the same

MINEKAWA YOHEI

Method and apparatus for reviewing defect

Defect observation method and defect observation device

HITACHI MEDICAL CORP

Ultrasound diagnostic device and method of generating an intermediary image of ultrasound image

HITACHI LTD

Optical inspection apparatus and method thereof

JAPAN FINE CERAMICS CT

Environmental resistant coating member