Inventor
KIM HYUN-JO
KR42 patents
⚠️ This page may combine multiple inventors who share the name “KIM HYUN-JO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SAMSUNG ELECTRONICS CO LTD
38 patentsUS7495984B2Feb 24, 2009
Resistive memory devices including selected reference memory cells
SAMSUNG ELECTRONICS CO LTD54 citations98
US7351594B2Apr 1, 2008
Methods of forming magnetic random access memory devices having titanium-rich lower electrodes with oxide layer and oriented tunneling barrier
SAMSUNG ELECTRONICS CO LTD102 citations98
US7352021B2Apr 1, 2008
Magnetic random access memory devices having titanium-rich lower electrodes with oxide layer and oriented tunneling barrier
SAMSUNG ELECTRONICS CO LTD96 citations98
US8878309B1Nov 4, 2014
Semiconductor device having 3D channels, and methods of fabricating semiconductor devices having 3D channels
SAMSUNG ELECTRONICS CO LTD105 citations97
US9379106B2Jun 28, 2016
Semiconductor devices having 3D channels, and methods of fabricating semiconductor devices having 3D channels
SAMSUNG ELECTRONICS CO LTD18 citations92
US7672155B2Mar 2, 2010
Resistive memory devices including selected reference memory cells
SAMSUNG ELECTRONICS CO LTD23 citations92
US7378698B2May 27, 2008
Magnetic tunnel junction and memory device including the same
SAMSUNG ELECTRONICS CO LTD51 citations92
US6952364B2Oct 4, 2005
Magnetic tunnel junction structures and methods of fabrication
SAMSUNG ELECTRONICS CO LTD30 citations92
US8345467B2Jan 1, 2013
Resistive memory devices including selected reference memory cells operating responsive to read operations
SAMSUNG ELECTRONICS CO LTD6 citations84
US8023311B2Sep 20, 2011
Resistive memory devices including selected reference memory cells operating responsive to read operations
SAMSUNG ELECTRONICS CO LTD7 citations84
US7218556B2May 15, 2007
Method of writing to MRAM devices
SAMSUNG ELECTRONICS CO LTD10 citations84
US7141438B2Nov 28, 2006
Magnetic tunnel junction structure having an oxidized buffer layer and method of fabricating the same
SAMSUNG ELECTRONICS CO LTD17 citations84
US9299811B2Mar 29, 2016
Methods of fabricating semiconductor devices
SAMSUNG ELECTRONICS CO LTD7 citations83
US10032886B2Jul 24, 2018
Semiconductor device
SAMSUNG ELECTRONICS CO LTD8 citations82
US9679896B2Jun 13, 2017
Moisture blocking structure and/or a guard ring, a semiconductor device including the same, and a method of manufacturing the same
SAMSUNG ELECTRONICS CO LTD15 citations78
US6838727B2Jan 4, 2005
Memory device using a transistor and one resistant element for storage
SAMSUNG ELECTRONICS CO LTD5 citations74
US10854452B2Dec 1, 2020
Method of manufacturing semiconductor devices
SAMSUNG ELECTRONICS CO LTD4 citations73
US7645619B2Jan 12, 2010
Magnetic random access memory device and method of forming the same
SAMSUNG ELECTRONICS CO LTD5 citations73
US11011511B2May 18, 2021
Electrostatic discharge protection devices
SAMSUNG ELECTRONICS CO LTD3 citations72
US10269928B2Apr 23, 2019
Semiconductor devices having 3D channels, and methods of fabricating semiconductor devices having 3D channels
SAMSUNG ELECTRONICS CO LTD3 citations72
US10074572B2Sep 11, 2018
Integrated circuit devices and methods of manufacturing the same
SAMSUNG ELECTRONICS CO LTD2 citations72
US10002943B2Jun 19, 2018
Semiconductor devices having 3D channels, and methods of fabricating semiconductor devices having 3D channels
SAMSUNG ELECTRONICS CO LTD4 citations72
US11183496B2Nov 23, 2021
Semiconductor device
SAMSUNG ELECTRONICS CO LTD0 citations63
US8035145B2Oct 11, 2011
Magnetic memory device
SAMSUNG ELECTRONICS CO LTD2 citations63
US7612969B2Nov 3, 2009
Magnetic memory device and method of fabricating the same
SAMSUNG ELECTRONICS CO LTD6 citations63
US7582890B2Sep 1, 2009
Magnetic tunnel junction structures having bended tips at both ends thereof, magnetic random access memory cells employing the same and photomasks used in formation thereof
SAMSUNG ELECTRONICS CO LTD3 citations62
US7504266B2Mar 17, 2009
Magnetic tunnel junction structures and methods of fabrication
SAMSUNG ELECTRONICS CO LTD2 citations62
US7372090B2May 13, 2008
Magnetic random access memory device and method of forming the same
SAMSUNG ELECTRONICS CO LTD2 citations62
US12074157B2Aug 27, 2024
Electrostatic discharge protection devices
SAMSUNG ELECTRONICS CO LTD0 citations61
US11626396B2Apr 11, 2023
Integrated circuit (IC) device
SAMSUNG ELECTRONICS CO LTD0 citations61
US11152349B2Oct 19, 2021
Integrated circuit (IC) device
SAMSUNG ELECTRONICS CO LTD0 citations61
US11145640B2Oct 12, 2021
Integrated circuit (IC) device
SAMSUNG ELECTRONICS CO LTD0 citations61
US10276567B2Apr 30, 2019
Semiconductor device
SAMSUNG ELECTRONICS CO LTD0 citations52
US10109629B2Oct 23, 2018
Semiconductor devices including gate structures with oxygen capturing films
SAMSUNG ELECTRONICS CO LTD0 citations52
US7732222B2Jun 8, 2010
Magnetic memory device and method of fabricating the same
SAMSUNG ELECTRONICS CO LTD0 citations52
US7009868B2Mar 7, 2006
Memory device having a transistor and one resistant element as a storing means and method for driving the memory device
SAMSUNG ELECTRONICS CO LTD1 citations52
US10714467B2Jul 14, 2020
Integrated circuit (IC) device
SAMSUNG ELECTRONICS CO LTD0 citations51
US9397234B2Jul 19, 2016
Pumping capacitor
SAMSUNG ELECTRONICS CO LTD0 citations51