Inventor

NGUYEN HUNG PHI

US25 patents

⚠️ This page may combine multiple inventors who share the name “NGUYEN HUNG PHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NGUYEN HUNG PHI

LUMINA INSTR INC

Time domain multiplexed defect scanner

Time domain multiplexed defect scanner

Region prober optical inspector

Scattered radiation defect depth detection

Scattered radiation optical scanner

Scanning micro profiler

Surface contour measurement

Slope, p-component and s-component measurement

Phase retardance optical scanner

KLA TENCOR CORP

Wafer edge inspection

3D microscope including insertable components to provide multiple imaging and measurement capabilities

3D microscope including insertable components to provide multiple imaging and measurement capabilities

3D microscope including insertable components to provide multiple imaging and measurement capabilities

3D microscope including insertable components to provide multiple imaging and measurement capabilities

KLA TENCOR TECH CORP

Wafer edge inspection

Wafer edge inspection

XU JAMES JIANGUO

3D microscope including insertable components to provide multiple imaging and measurement capabilities

System and method for monitoring LED chip surface roughening process

HOU ZHEN

3D microscope and methods of measuring patterned substrates

KLA TENCOR TECHNOLOGIES

Method of detecting the thickness of thin film disks or wafers

LUMINA INSTRAMENTS INC

Angle independent optical surface inspector

ZETA INSTR INC

3D microscope and methods of measuring patterned substrates

LUMINA INSTR

Region prober optical inspector

HARTZELL JOHN

Floating optical sensor mount

BINA DAVID

Optical sensor and mounting interface