P

Inventor

CHOU CHIA CHENG

TW45 patents
⚠️ This page may combine multiple inventors who share the name “CHOU CHIA CHENG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TAIWAN SEMICONDUCTOR MFG CO LTD

23 patents
US10163691B2Dec 25, 2018

Low-K dielectric interconnect systems

TAIWAN SEMICONDUCTOR MFG CO LTD36 citations94
US9754822B1Sep 5, 2017

Interconnect structure and method

TAIWAN SEMICONDUCTOR MFG CO LTD30 citations94
US9679804B1Jun 13, 2017

Multi-patterning to form vias with straight profiles

TAIWAN SEMICONDUCTOR MFG CO LTD19 citations92
US10269627B2Apr 23, 2019

Interconnect structure and method

TAIWAN SEMICONDUCTOR MFG CO LTD4 citations84
US11929329B2Mar 12, 2024

Damascene process using cap layer

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations75
US11929281B2Mar 12, 2024

Reducing oxidation by etching sacrificial and protection layer separately

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11049763B2Jun 29, 2021

Multi-patterning to form vias with straight profiles

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US10840134B2Nov 17, 2020

Interconnect structure and method

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US9768061B1Sep 19, 2017

Low-k dielectric interconnect systems

TAIWAN SEMICONDUCTOR MFG CO LTD4 citations73
US10707165B2Jul 7, 2020

Semiconductor device having an extra low-k dielectric layer and method of forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD4 citations72
US12424438B2Sep 23, 2025

Low-k dielectric and processes for forming same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12255138B2Mar 18, 2025

Interconnect structures of semiconductor device and methods of forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11923294B2Mar 5, 2024

Interconnect structures of semiconductor device and methods of forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11417602B2Aug 16, 2022

Semiconductor device having an extra low-k dielectric layer and method of forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11373947B2Jun 28, 2022

Methods of forming interconnect structures of semiconductor device

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11328952B2May 10, 2022

Interconnect structure and method

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11062901B2Jul 13, 2021

Low-k dielectric and processes for forming same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US10910216B2Feb 2, 2021

Low-k dielectric and processes for forming same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12062613B2Aug 13, 2024

Semiconductor device having an extra low-k dielectric layer and method of forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US10510585B2Dec 17, 2019

Multi-patterning to form vias with straight profiles

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9748134B2Aug 29, 2017

Method of making interconnect structure

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9589856B2Mar 7, 2017

Automatically adjusting baking process for low-k dielectric material

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations52
US9236294B2Jan 12, 2016

Method for forming semiconductor device structure

TAIWAN SEMICONDUCTOR MFG CO LTD1 citations52

TAIWAN SEMICONDUCTOR MFG

13 patents
US7968451B2Jun 28, 2011

Method for forming self-assembled mono-layer liner for Cu/porous low-k interconnections

TAIWAN SEMICONDUCTOR MFG8 citations84
US7723226B2May 25, 2010

Interconnects containing bilayer porous low-k dielectrics using different porogen to structure former ratio

TAIWAN SEMICONDUCTOR MFG11 citations84
US9257331B2Feb 9, 2016

Method of making interconnect structure

TAIWAN SEMICONDUCTOR MFG1 citations63
US7485949B2Feb 3, 2009

Semiconductor device

TAIWAN SEMICONDUCTOR MFG4 citations63
US7466027B2Dec 16, 2008

Interconnect structures with surfaces roughness improving liner and methods for fabricating the same

TAIWAN SEMICONDUCTOR MFG5 citations63
US7314828B2Jan 1, 2008

Repairing method for low-k dielectric materials

TAIWAN SEMICONDUCTOR MFG6 citations63
US8043959B2Oct 25, 2011

Method of forming a low-k dielectric layer with improved damage resistance and chemical integrity

TAIWAN SEMICONDUCTOR MFG3 citations62
US9004914B2Apr 14, 2015

Method of and apparatus for active energy assist baking

TAIWAN SEMICONDUCTOR MFG0 citations52
US8877083B2Nov 4, 2014

Surface treatment in the formation of interconnect structure

TAIWAN SEMICONDUCTOR MFG0 citations52
US8354346B2Jan 15, 2013

Method for fabricating low-k dielectric and Cu interconnect

TAIWAN SEMICONDUCTOR MFG0 citations52
US7998873B2Aug 16, 2011

Method for fabricating low-k dielectric and Cu interconnect

TAIWAN SEMICONDUCTOR MFG0 citations52
US9373581B2Jun 21, 2016

Interconnect structure and method for forming the same

TAIWAN SEMICONDUCTOR MFG0 citations51
US8993442B2Mar 31, 2015

Interconnect structure and method for forming the same

TAIWAN SEMICONDUCTOR MFG1 citations51

KO CHUNG-CHI

3 patents

CHI HUA FITNESS CO LTD

1 patent

SHIH PO-CHENG

1 patent

LIOU JOUNG-WEI

1 patent

SINGTEX IND CO LTD

1 patent

CHOU CHIA-CHENG

1 patent

KO CHUNG CHI

1 patent