Inventor · disambiguated record
Seung Soo Hong
Also filed as: HONG SEUNG SOO
22 granted patents·6 pending applications·60 citations·filing 2006–2024
93Inventor score
Files withSAMSUNG ELECTRONICS CO LTD13KOREA RES INST OF STANDARDS6SAMSUNG DISPLAY CO LTD3HYUNDAI MOBIS CO LTD2HYUNDAI MOTOR CO LTD2
Top patents by PatentIndex Score
28 records- 0195US10896957B2Semiconductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Jan 19, 2021·9 cites·18 claims
- 0294US11901359B2Method of manufacturing a semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Feb 13, 2024·2 cites·20 claims
- 0394US9876013B1Semiconductor devices and methods of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Jan 23, 2018·14 cites·20 claims
- 0493US12100735B2Semiconductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Sep 24, 2024·1 cites·18 claims
- 0593US11621196B2Semiconductor device and method for fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Apr 4, 2023·2 cites·20 claims
- 0692US10395990B2Semiconductor device and method for fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Aug 27, 2019·7 cites·20 claims
- 0789US11332611B2Composition for radar transmissive cover for vehicleHYUNDAI MOTOR CO LTD·Filed 2020·Granted May 17, 2022·2 cites·7 claims
- 0887US11189615B2Semiconductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Nov 30, 2021·2 cites·19 claims
- 0986US10840139B2Semiconductor device and method for fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Nov 17, 2020·4 cites·20 claims
- 1083US11037829B2Semiconductor device and method for fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Jun 15, 2021·2 cites·19 claims
- 1179US12125750B2Semiconductor device and method for fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Oct 22, 2024·0 cites·20 claims
- 1276US7735373B2Apparatus for measuring pressure in a vessel using magnetostrictive acoustic transducerKOREA RES INST OF STANDARDS·Filed 2008·Granted Jun 15, 2010·9 cites·15 claims
- 1373US10002967B2Semiconductor devices having fin-shaped patterns with inflection pointsSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Jun 19, 2018·2 cites·13 claims
- 1469US11600698B2Semiconductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Mar 7, 2023·0 cites·20 claims
- 1565US11555112B2Composition for rack housing member of vehicle having excellent dimensional stability and rack housing member of vehicle prepared using the sameHYUNDAI MOBIS CO LTD·Filed 2020·Granted Jan 17, 2023·0 cites·14 claims
- 1663US2023227648A1Resin molded product having high impact resistance and low dielectric loss and radar module including sameHYUNDAI MOBIS CO LTD·Filed 2022·Application pending·0 cites
- 1762US2025169292A1Display deviceSAMSUNG DISPLAY CO LTD·Filed 2024·Application pending·0 cites
- 1861US11812633B2Display device including an inorganic pattern positioned in a peripheral area of the substrateSAMSUNG DISPLAY CO LTD·Filed 2021·Granted Nov 7, 2023·0 cites·14 claims
- 1957US11566131B2Composite resin composition with excellent dimensional stabilityHYUNDAI MOTOR CO LTD·Filed 2020·Granted Jan 31, 2023·0 cites·9 claims
- 2052US2023284475A1Display deviceSAMSUNG DISPLAY CO LTD·Filed 2022·Application pending·0 cites
- 2147US7784352B2Apparatus for measuring pressure by using diaphragm and method of pressure measurement by using diaphragmKOREA RES INST OF STANDARDS·Filed 2008·Granted Aug 31, 2010·1 cites·5 claims
- 2245US7716991B2Apparatus for measuring pressure using acoustic impedance variationKOREA RES INST OF STANDARDS·Filed 2008·Granted May 18, 2010·1 cites·8 claims
- 2345US7456633B2Apparatus for and method of measuring composition and pressure of the discharged gas from ion gauge using residual gas analyzerKOREAN RES INST OF STANDARDS A·Filed 2006·Granted Nov 25, 2008·2 cites·7 claims
- 2445US2009064756A1Vacuum gauge calibration apparatus capable of calibrating and testing without displacement and operating method thereofKOREA RES INST OF STANDARDS·Filed 2007·Application pending·0 cites
- 2540US2019348414A1Semiconductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 2018·Application pending·0 cites
- 2637US7228742B2Pressure measuring system for vacuum chamber using ultrasonic waveKOREA RES INST OF STANDARDS·Filed 2006·Granted Jun 12, 2007·0 cites·11 claims
- 2734US2009277273A1Apparatus for measuring pressure in a vessel using acoustic impedance matching layersHONG SEUNG SOO·Filed 2008·Application pending·0 cites
- 2832US7569178B2Apparatus and method for in-situ calibration of vacuum gauge by absolute method and comparison methodKOREA RES INST OF STANDARDS·Filed 2006·Granted Aug 4, 2009·0 cites·6 claims
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →