Inventor

LONG YIN

CN10 patents

⚠️ This page may combine multiple inventors who share the name “LONG YIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SHANGHAI HUALI MICROELECT CORP

4 patents

US8865482B2Oct 21, 2014

Method of detecting the circular uniformity of the semiconductor circular contact holes

SHANGHAI HUALI MICROELECT CORP37 citations89

US9269639B2Feb 23, 2016

Method of detecting and measuring contact alignment shift relative to gate structures in a semicondcutor device

SHANGHAI HUALI MICROELECT CORP2 citations54

US8658438B2Feb 25, 2014

Measurement of lateral diffusion of implanted ions in doped well region of semiconductor devices

SHANGHAI HUALI MICROELECT CORP0 citations37

US8987013B2Mar 24, 2015

Method of inspecting misalignment of polysilicon gate

SHANGHAI HUALI MICROELECT CORP0 citations36

SHANGHAI HUALI INTEGRATED CIRCUIT CORP

2 patents

US12198061B2Jan 14, 2025

Method and apparatus for predicting yield of semiconductor devices

SHANGHAI HUALI INTEGRATED CIRCUIT CORP0 citations48

US11307151B2Apr 19, 2022

Method for detecting wafer backside defect

SHANGHAI HUALI INTEGRATED CIRCUIT CORP0 citations44

WISCONSIN ALUMNI RES FOUND

1 patent

US11344719B2May 31, 2022

Electric bandage for accelerated wound recovery

WISCONSIN ALUMNI RES FOUND4 citations70

IBM

1 patent

US11080626B2Aug 3, 2021

Job assignment optimization

IBM2 citations65

HUAWEI TECH CO LTD

1 patent

US11687488B2Jun 27, 2023

Directory deletion method and apparatus, and storage server

HUAWEI TECH CO LTD0 citations41

SHANGAI HUALI MICROELECTRONICS CORP

1 patent

US9080863B2Jul 14, 2015

Method for monitoring alignment between contact holes and polycrystalline silicon gate

SHANGAI HUALI MICROELECTRONICS CORP0 citations24