Inventor

TAKESHIMA TOMOCHIKA

JP7 patents

⚠️ This page may combine multiple inventors who share the name “TAKESHIMA TOMOCHIKA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HAMAMATSU PHOTONICS KK

5 patents

US12094138B2Sep 17, 2024

Semiconductor inspection device and semiconductor inspection method

HAMAMATSU PHOTONICS KK0 citations60

US12360056B2Jul 15, 2025

Semiconductor apparatus examination method and semiconductor apparatus examination apparatus

HAMAMATSU PHOTONICS KK0 citations49

US12211199B2Jan 28, 2025

Method for inspecting semiconductor and semiconductor inspecting device

HAMAMATSU PHOTONICS KK0 citations49

US12044729B2Jul 23, 2024

Semiconductor device examination method and semiconductor device examination device

HAMAMATSU PHOTONICS KK0 citations49

US10055638B2Aug 21, 2018

Image processing device, imaging device, microscope device, image processing method, and image processing program

HAMAMATSU PHOTONICS KK0 citations36

SUGIYAMA NORIKAZU

1 patent

US9405958B2Aug 2, 2016

Cell analysis method, cell analysis device, and cell analysis program

SUGIYAMA NORIKAZU2 citations59

TAKESHIMA TOMOCHIKA

1 patent

US8885919B2Nov 11, 2014

Semiconductor fault analysis device and fault analysis method

TAKESHIMA TOMOCHIKA0 citations28