Inventor · disambiguated record

John A. Michlowsky

Also filed as: MICHLOWSKY JOHN A

1 granted patent·10 citations·filing 1995–1995

32Inventor score

Technology areasG11C

Files withSGS THOMSON MICROELECTRONICS1

Top patents by PatentIndex Score

1 record

0142US5633828ACircuitry and methodology to test single bit failures of integrated circuit memory devicesSGS THOMSON MICROELECTRONICS·Filed 1995·Granted May 27, 1997·10 cites·40 claims

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