Inventor

BRYSON III CHARLES E

US14 patents

⚠️ This page may combine multiple inventors who share the name “BRYSON III CHARLES E”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

BRYSON III CHARLES E

2 patents

US6803570B1Oct 12, 2004

Electron transmissive window usable with high pressure electron spectrometry

BRYSON III CHARLES E69 citations93

US5105932AApr 21, 1992

Linear and rotary positioning device

BRYSON III CHARLES E25 citations89

KEVEX CORP

2 patents

US4680467AJul 14, 1987

Electron spectroscopy system for chemical analysis of electrically isolated specimens

KEVEX CORP45 citations92

US4764673AAug 16, 1988

Electric electron energy analyzer

KEVEX CORP21 citations81

LUCENT TECHNOLOGIES INC

2 patents

US5756887AMay 26, 1998

Mechanism for changing a probe balance beam in a scanning probe microscope

LUCENT TECHNOLOGIES INC18 citations83

US6178653B1Jan 30, 2001

Probe tip locator

LUCENT TECHNOLOGIES INC13 citations68

HEWLETT PACKARD CO

2 patents

US4227079AOct 7, 1980

Multipath fine positioning beam director

HEWLETT PACKARD CO10 citations73

US4480913ANov 6, 1984

Fine positioning beam director system

HEWLETT PACKARD CO4 citations58

SURFACE INTERFACE INC

2 patents

US6244103B1Jun 12, 2001

Interpolated height determination in an atomic force microscope

SURFACE INTERFACE INC13 citations69

US5466933ANov 14, 1995

Dual electron analyzer

SURFACE INTERFACE INC6 citations60

FEI CO

1 patent

US6399944B1Jun 4, 2002

Measurement of film thickness by inelastic electron scattering

FEI CO77 citations90

APPARATI INC

1 patent

US7928381B1Apr 19, 2011

Coaxial charged particle energy analyzer

APPARATI INC10 citations78

AGERE SYST GUARDIAN CORP

1 patent

US6246060B1Jun 12, 2001

Apparatus for holding and aligning a scanning electron microscope sample

AGERE SYST GUARDIAN CORP13 citations65

KELLY MICHAEL A

1 patent

US7141800B2Nov 28, 2006

Non-dispersive charged particle energy analyzer

KELLY MICHAEL A0 citations51