Inventor

ECKERT MARTIN

DE57 patents

⚠️ This page may combine multiple inventors who share the name “ECKERT MARTIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ECKERT MARTIN

IBM

Adjustable load transmitter

Adjustable load transmitter

Probe card alignment

Adjustable load transmitter

Determining categories for memory fail conditions

SOI array sense and write margin qualification

Content addressable memory with match hit quality indication

Adjustable load transmitter

Probe card alignment

Probe card alignment

Layout effect characterization for integrated circuits

Module testing utilizing wafer probe test equipment

Soldering three dimensional integrated circuits

Wafer probe alignment

Wafer probe alignment

Device for positioning a semiconductor die in a wafer prober

Probe card alignment

Stressing integrated circuits using a radiation source

Reducing latency in a channel adapter by accelerated I/O control block processing

Content addressable memory with match hit quality indication

Content addressable memory with match hit quality indication

Memory array with multiple read ports

Layout effect characterization for integrated circuits

Layout effect characterization for integrated circuits

RAM at speed flexible timing and setup control

RAM at speed flexible timing and setup control

Integrated circuit with optical tunnel

Method for electrical testing of a 3-D chip stack

Chip attach frame

Module testing utilizing wafer probe test equipment

Chip attach frame

System for electrical testing and manufacturing of a 3-D chip stack and method

LUK LAMELLEN & KUPPLUNGSBAU

Transmission mechanism comprising a shifting device

Motor vehicle with a gearbox and method for operating a motor vehicle

Method of keeping track of the operating position of an actuator in an automated gear-shift transmission

Transmission mechanism comprising a shifting device

Transmission mechanism comprising a shifting device

ECKERT MARTIN

Chip attach frame

Method and system for performing self-tests in an electronic system

Test fail analysis on VLSI chips

Determining local voltage in an electronic system

SIRONA DENTAL SYSTEMS GMBH

X-ray sensitive camera comprising two image receivers and X-ray device

X-ray sensitive camera comprising two image receivers and X-ray device

RUNGE FRED

Method, spoken dialog system, and telecommunications terminal device for multilingual speech output

Method and system for adapting interactions

DEUTSCHE TELEKOM AG

Dialogue system with logical evaluation for language identification in speech recognition

GLOBALFOUNDRIES INC

Power noise histogram of a computer system

YAHOO INC

Visibly distinguishing portions of compound words

BUECHNER THOMAS

Detecting an unstable input to an IC

AXNIX CHRISTINE

Method and device for configuring functional capabilities in a data processing system