Inventor
TORREITER OTTO ANDREAS
DE9 patents
Patents
9 patentsUS7650554B2Jan 19, 2010
Method and an integrated circuit for performing a test
IBM9 citations83
US6774656B2Aug 10, 2004
Self-test for leakage current of driver/receiver stages
IBM13 citations82
US6725171B2Apr 20, 2004
Self-test with split, asymmetric controlled driver output stage
IBM12 citations71
US11262381B2Mar 1, 2022
Device for positioning a semiconductor die in a wafer prober
IBM2 citations66
US11209479B2Dec 28, 2021
Stressing integrated circuits using a radiation source
IBM0 citations61
US12292472B2May 6, 2025
Testing a single chip in a wafer probing system
IBM0 citations59
US11808808B2Nov 7, 2023
Testing a single chip in a wafer probing system
IBM0 citations59
US11239152B2Feb 1, 2022
Integrated circuit with optical tunnel
IBM0 citations50
US11574695B1Feb 7, 2023
Logic built-in self-test of an electronic circuit
IBM0 citations49