Inventor

MORI HISAYA

JP25 patents

⚠️ This page may combine multiple inventors who share the name “MORI HISAYA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MORI HISAYA

RENESAS TECH CORP

Apparatus for testing semiconductor integrated circuit

Apparatus for testing semiconductor integrated circuit

Apparatus and method for testing semiconductor integrated circuit

External test auxiliary device to be used for testing semiconductor device

Test circuit for evaluating characteristic of analog signal of device

Semiconductor test apparatus, and method of testing semiconductor device

Data storage apparatus and data measuring apparatus

MITSUBISHI ELECTRIC CORP

Tester for semiconductor integrated circuits and method for testing semiconductor integrated circuits

Threshold analysis system capable of deciding all threshold voltages included in memory device through single processing

External test ancillary device to be used for testing semiconductor device, and method of testing semiconductor device using the device

Tester for semiconductor integrated circuits

Apparatus and method for testing semiconductor integrated circuit

Semiconductor test apparatus and method

AWATA SHINJI

Seat configuration member and vehicle seat employing the seat configuration member

Seat backboard and vehicle seat

Vehicle seat and seat back board

Vehicle seat and resin seatback spring

TOYOTA BOSHOKU KK

Air conditioning seat

Vehicle headrest

Vehicle headrest

Toyota Boshoku Kaisha

Vehicle seats

RYODEN SEMICONDUCTOR SYST ENG

Jitter measurement circuit for measuring jitter of measurement target signal on the basis of sampling data string obtained by using ideal cyclic signal

MORI HISAYA

Vehicle seat and seat back board

RENESAS SEMICONDUCTOR ENGINEER

Apparatus and method for testing semiconductor integrated circuit

RENESAS ELECTRONICS CORP

Semiconductor device and semiconductor system