Inventor

FUNAKURA TERUHIKO

JP22 patents

⚠️ This page may combine multiple inventors who share the name “FUNAKURA TERUHIKO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

FUNAKURA TERUHIKO

MITSUBISHI ELECTRIC CORP

Tester for semiconductor integrated circuits and method for testing semiconductor integrated circuits

Threshold analysis system capable of deciding all threshold voltages included in memory device through single processing

Semiconductor test apparatus for measuring power supply current of semiconductor device

LSI testing apparatus and timing calibration method for use therewith

External test ancillary device to be used for testing semiconductor device, and method of testing semiconductor device using the device

Tester for semiconductor integrated circuits

Apparatus and method for testing semiconductor integrated circuit

Semiconductor test apparatus and method

Semiconductor integrated circuit with internal compensation for changes in time delay

Semiconductor test apparatus

LSI testing apparatus

Semiconductor tester, and method of testing semiconductor using the same

RENESAS TECH CORP

Apparatus for testing semiconductor integrated circuit

Apparatus for testing semiconductor integrated circuit

Apparatus and method for testing semiconductor integrated circuit

Interface circuit coupling semiconductor test apparatus with tested semiconductor device

External test auxiliary device to be used for testing semiconductor device

Test circuit for evaluating characteristic of analog signal of device

Semiconductor test apparatus, and method of testing semiconductor device

Data storage apparatus and data measuring apparatus

RYODEN SEMICONDUCTOR SYST ENG

Jitter measurement circuit for measuring jitter of measurement target signal on the basis of sampling data string obtained by using ideal cyclic signal

RENESAS SEMICONDUCTOR ENGINEER

Apparatus and method for testing semiconductor integrated circuit