Inventor
YOKHIN BORIS
IL37 patents
⚠️ This page may combine multiple inventors who share the name “YOKHIN BORIS”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
JORDAN VALLEY APPLIED RADIATION LTD
24 patentsUS7120228B2Oct 10, 2006
Combined X-ray reflectometer and diffractometer
JORDAN VALLEY APPLIED RADIATION LTD131 citations99
US6556652B1Apr 29, 2003
Measurement of critical dimensions using X-rays
JORDAN VALLEY APPLIED RADIATION LTD89 citations98
US6381303B1Apr 30, 2002
X-ray microanalyzer for thin films
JORDAN VALLEY APPLIED RADIATION LTD178 citations98
US6108398AAug 22, 2000
X-ray microfluorescence analyzer
JORDAN VALLEY APPLIED RADIATION LTD108 citations98
US6895075B2May 17, 2005
X-ray reflectometry with small-angle scattering measurement
JORDAN VALLEY APPLIED RADIATION LTD132 citations97
US6512814B2Jan 28, 2003
X-ray reflectometer
JORDAN VALLEY APPLIED RADIATION LTD90 citations97
US7110491B2Sep 19, 2006
Measurement of critical dimensions using X-ray diffraction in reflection mode
JORDAN VALLEY APPLIED RADIATION LTD57 citations96
US7076024B2Jul 11, 2006
X-ray apparatus with dual monochromators
JORDAN VALLEY APPLIED RADIATION LTD61 citations96
US6680996B2Jan 20, 2004
Dual-wavelength X-ray reflectometry
JORDAN VALLEY APPLIED RADIATION LTD55 citations96
US6639968B2Oct 28, 2003
X-ray reflectometer
JORDAN VALLEY APPLIED RADIATION LTD71 citations96
US6389102B2May 14, 2002
X-ray array detector
JORDAN VALLEY APPLIED RADIATION LTD89 citations95
US6947520B2Sep 20, 2005
Beam centering and angle calibration for X-ray reflectometry
JORDAN VALLEY APPLIED RADIATION LTD27 citations93
US6041095AMar 21, 2000
X-ray fluorescence analyzer
JORDAN VALLEY APPLIED RADIATION LTD39 citations93
US7113566B1Sep 26, 2006
Enhancing resolution of X-ray measurements by sample motion
JORDAN VALLEY APPLIED RADIATION LTD31 citations92
US7103142B1Sep 5, 2006
Material analysis using multiple X-ray reflectometry models
JORDAN VALLEY APPLIED RADIATION LTD19 citations92
US7068753B2Jun 27, 2006
Enhancement of X-ray reflectometry by measurement of diffuse reflections
JORDAN VALLEY APPLIED RADIATION LTD28 citations92
US6453002B1Sep 17, 2002
Differential measurement of X-ray microfluorescence
JORDAN VALLEY APPLIED RADIATION LTD44 citations92
US7481579B2Jan 27, 2009
Overlay metrology using X-rays
JORDAN VALLEY APPLIED RADIATION LTD23 citations89
US7035375B2Apr 25, 2006
X-ray scattering with a polychromatic source
JORDAN VALLEY APPLIED RADIATION LTD14 citations84
US7245695B2Jul 17, 2007
Detection of dishing and tilting using X-ray fluorescence
JORDAN VALLEY APPLIED RADIATION LTD14 citations83
US7474732B2Jan 6, 2009
Calibration of X-ray reflectometry system
JORDAN VALLEY APPLIED RADIATION LTD12 citations81
US7231016B2Jun 12, 2007
Efficient measurement of diffuse X-ray reflections
JORDAN VALLEY APPLIED RADIATION LTD9 citations74
US6907108B2Jun 14, 2005
Dual-wavelength x-ray monochromator
JORDAN VALLEY APPLIED RADIATION LTD5 citations74
US6535575B2Mar 18, 2003
Pulsed X-ray reflectometer
JORDAN VALLEY APPLIED RADIATION LTD9 citations74
JORDAN VALLEY SEMICONDUCTORS
9 patentsUS7551719B2Jun 23, 2009
Multifunction X-ray analysis system
JORDAN VALLEY SEMICONDUCTORS120 citations98
US7680243B2Mar 16, 2010
X-ray measurement of properties of nano-particles
JORDAN VALLEY SEMICONDUCTORS55 citations95
US7483513B2Jan 27, 2009
Measurement of properties of thin films on sidewalls
JORDAN VALLEY SEMICONDUCTORS26 citations93
US7600916B2Oct 13, 2009
Target alignment for X-ray scattering measurements
JORDAN VALLEY SEMICONDUCTORS21 citations92
US7653174B2Jan 26, 2010
Inspection of small features using X-ray fluorescence
JORDAN VALLEY SEMICONDUCTORS29 citations91
US7649978B2Jan 19, 2010
Automated selection of X-ray reflectometry measurement locations
JORDAN VALLEY SEMICONDUCTORS7 citations71
US7321652B2Jan 22, 2008
Multi-detector EDXRD
JORDAN VALLEY SEMICONDUCTORS4 citations61
US7804934B2Sep 28, 2010
Accurate measurement of layer dimensions using XRF
JORDAN VALLEY SEMICONDUCTORS5 citations58
US9390984B2Jul 12, 2016
X-ray inspection of bumps on a semiconductor substrate
JORDAN VALLEY SEMICONDUCTORS0 citations41