Inventor
WONG HARIANTO
US31 patents
⚠️ This page may combine multiple inventors who share the name “WONG HARIANTO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ALLEGRO MICROSYSTEMS LLC
16 patentsUS10352969B2Jul 16, 2019
Systems and methods for integrated shielding in a current sensor
ALLEGRO MICROSYSTEMS LLC14 citations94
US9857437B2Jan 2, 2018
Hall effect sensing element
ALLEGRO MICROSYSTEMS LLC15 citations93
US9318481B1Apr 19, 2016
Electrostatic discharge protection device
ALLEGRO MICROSYSTEMS LLC20 citations91
US9865807B2Jan 9, 2018
Packaging for an electronic device
ALLEGRO MICROSYSTEMS LLC16 citations90
US11630169B1Apr 18, 2023
Fabricating a coil above and below a magnetoresistance element
ALLEGRO MICROSYSTEMS LLC4 citations74
US11782105B2Oct 10, 2023
Fabricating planarized coil layer in contact with magnetoresistance element
ALLEGRO MICROSYSTEMS LLC3 citations73
US11296247B2Apr 5, 2022
Photodetector with a buried layer
ALLEGRO MICROSYSTEMS LLC3 citations73
US11262385B2Mar 1, 2022
Systems and methods for integrated shielding in a current sensor
ALLEGRO MICROSYSTEMS LLC4 citations73
US10868240B2Dec 15, 2020
Electronic circuit structure and method of fabricating electronic circuit structure having magnetoresistance element with improved electrical contacts
ALLEGRO MICROSYSTEMS LLC6 citations73
US10622549B2Apr 14, 2020
Signal isolator having interposer
ALLEGRO MICROSYSTEMS LLC2 citations73
US10593869B2Mar 17, 2020
Methods for patterning a magnetic sensing layer
ALLEGRO MICROSYSTEMS LLC3 citations73
US12210040B2Jan 28, 2025
Systems and methods for integrated shielding in a current sensor
ALLEGRO MICROSYSTEMS LLC0 citations62
US11217718B2Jan 4, 2022
Photodetector with a buried layer
ALLEGRO MICROSYSTEMS LLC1 citations62
US11327882B2May 10, 2022
Method and apparatus for eliminating bit disturbance errors in non-volatile memory devices
ALLEGRO MICROSYSTEMS LLC1 citations57
US11170858B2Nov 9, 2021
Method and apparatus for eliminating EEPROM bit-disturb
ALLEGRO MICROSYSTEMS LLC1 citations55
US10162020B2Dec 25, 2018
Hall effect sensing element
ALLEGRO MICROSYSTEMS LLC0 citations52
CHARTERED SEMICONDUCTOR MFG
5 patentsUS5731239AMar 24, 1998
Method of making self-aligned silicide narrow gate electrodes for field effect transistors having low sheet resistance
CHARTERED SEMICONDUCTOR MFG174 citations99
US5869396AFeb 9, 1999
Method for forming a polycide gate electrode
CHARTERED SEMICONDUCTOR MFG86 citations96
US6017803AJan 25, 2000
Method to prevent dishing in chemical mechanical polishing
CHARTERED SEMICONDUCTOR MFG37 citations92
US5956137ASep 21, 1999
In-line process monitoring using micro-raman spectroscopy
CHARTERED SEMICONDUCTOR MFG31 citations92
US6069082AMay 30, 2000
Method to prevent dishing in damascene CMP process
CHARTERED SEMICONDUCTOR MFG12 citations74
VISHAY INTERTECHNOLOGY INC
4 patentsUS6538300B1Mar 25, 2003
Precision high-frequency capacitor formed on semiconductor substrate
VISHAY INTERTECHNOLOGY INC39 citations96
US6621143B2Sep 16, 2003
Precision high-frequency capacitor on semiconductor substrate
VISHAY INTERTECHNOLOGY INC12 citations73
US6621142B2Sep 16, 2003
Precision high-frequency capacitor formed on semiconductor substrate
VISHAY INTERTECHNOLOGY INC12 citations73
US8004063B2Aug 23, 2011
Precision high-frequency capacitor formed on semiconductor substrate
VISHAY INTERTECHNOLOGY INC6 citations71