P

Inventor

TOMIMATSU SATOSHI

JP72 patents
⚠️ This page may combine multiple inventors who share the name “TOMIMATSU SATOSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HITACHI LTD

31 patents
US6927391B2Aug 9, 2005

Method and apparatus for processing a micro sample

HITACHI LTD69 citations99
US6781125B2Aug 24, 2004

Method and apparatus for processing a micro sample

HITACHI LTD114 citations99
US6664552B2Dec 16, 2003

Method and apparatus for specimen fabrication

HITACHI LTD139 citations99
US6538254B1Mar 25, 2003

Method and apparatus for sample fabrication

HITACHI LTD315 citations99
US6734687B1May 11, 2004

Apparatus for detecting defect in device and method of detecting defect

HITACHI LTD134 citations98
US7071475B2Jul 4, 2006

Method and apparatus for specimen fabrication

HITACHI LTD61 citations97
US6828566B2Dec 7, 2004

Method and apparatus for specimen fabrication

HITACHI LTD62 citations97
US7550750B2Jun 23, 2009

Method and apparatus for processing a micro sample

HITACHI LTD26 citations96
US7205554B2Apr 17, 2007

Method and apparatus for processing a micro sample

HITACHI LTD34 citations96
US7205560B2Apr 17, 2007

Method and apparatus for processing a micro sample

HITACHI LTD32 citations96
US7138628B2Nov 21, 2006

Method and apparatus for specimen fabrication

HITACHI LTD35 citations96
US6794663B2Sep 21, 2004

Method and apparatus for specimen fabrication

HITACHI LTD33 citations96
US6583426B1Jun 24, 2003

Projection ion beam machining apparatus

HITACHI LTD56 citations96
US7888639B2Feb 15, 2011

Method and apparatus for processing a micro sample

HITACHI LTD14 citations93
US7525108B2Apr 28, 2009

Focused ion beam apparatus for specimen fabrication

HITACHI LTD16 citations93
US7470918B2Dec 30, 2008

Method and apparatus for processing a micro sample

HITACHI LTD22 citations93
US7465945B2Dec 16, 2008

Method and apparatus for processing a micro sample

HITACHI LTD20 citations93
US7397052B2Jul 8, 2008

Method and apparatus for specimen fabrication

HITACHI LTD16 citations93
US7397050B2Jul 8, 2008

Method and apparatus for specimen fabrication

HITACHI LTD16 citations93
US7176458B2Feb 13, 2007

Method and apparatus for specimen fabrication

HITACHI LTD18 citations93
US6627889B2Sep 30, 2003

Apparatus and method for observing sample using electron beam

HITACHI LTD21 citations93
US7897936B2Mar 1, 2011

Method and apparatus for specimen fabrication

HITACHI LTD15 citations92
US7268356B2Sep 11, 2007

Method and apparatus for specimen fabrication

HITACHI LTD28 citations92
US7397051B2Jul 8, 2008

Method and apparatus for specimen fabrication

HITACHI LTD8 citations82
US7999240B2Aug 16, 2011

Method and apparatus for specimen fabrication

HITACHI LTD4 citations74
US7791050B2Sep 7, 2010

Method and apparatus for specimen fabrication

HITACHI LTD4 citations74
US7372050B2May 13, 2008

Method of preventing charging, and apparatus for charged particle beam using the same

HITACHI LTD5 citations74
US6977376B2Dec 20, 2005

Method of prevention charging, and apparatus for charged particle beam using the same

HITACHI LTD6 citations74
US6774363B2Aug 10, 2004

Method of preventing charging, and apparatus for charged particle beam using the same

HITACHI LTD5 citations74
US5910871AJun 8, 1999

Magnetic head having track width specified by grooves formed with projection ion beam

HITACHI LTD16 citations74
US7301146B2Nov 27, 2007

Probe driving method, and probe apparatus

HITACHI LTD8 citations73

HITACHI HIGH TECH CORP

7 patents
US8779400B2Jul 15, 2014

Ion source, ion beam processing/observation apparatus, charged particle beam apparatus, and method for observing cross section of sample

HITACHI HIGH TECH CORP91 citations98
US6858851B2Feb 22, 2005

Apparatus for specimen fabrication and method for specimen fabrication

HITACHI HIGH TECH CORP57 citations96
US7326942B2Feb 5, 2008

Ion beam system and machining method

HITACHI HIGH TECH CORP24 citations93
US7700931B2Apr 20, 2010

Ion beam processing apparatus

HITACHI HIGH TECH CORP20 citations92
US7952083B2May 31, 2011

Ion beam system and machining method

HITACHI HIGH TECH CORP11 citations84
US7482603B2Jan 27, 2009

Apparatus and method for specimen fabrication

HITACHI HIGH TECH CORP10 citations83
US7725278B2May 25, 2010

Method for failure analysis and system for failure analysis

HITACHI HIGH TECH CORP3 citations63

HITACHI ULSI SYS CO LTD

2 patents
US6960765B2Nov 1, 2005

Probe driving method, and probe apparatus

HITACHI ULSI SYS CO LTD50 citations96
US6970004B2Nov 29, 2005

Apparatus for inspecting defects of devices and method of inspecting defects

HITACHI ULSI SYS CO LTD18 citations92

SHICHI HIROYASU

2 patents
US8481980B2Jul 9, 2013

Ion source, ion beam processing/observation apparatus, charged particle beam apparatus, and method for observing cross section of sample

SHICHI HIROYASU17 citations92
US8115184B2Feb 14, 2012

Gas field ion source, charged particle microscope, and apparatus

SHICHI HIROYASU20 citations92

TOKUDA MITSUO

2 patents
US8222618B2Jul 17, 2012

Method and apparatus for processing a microsample

TOKUDA MITSUO9 citations91
US8618520B2Dec 31, 2013

Method and apparatus for processing a micro sample

TOKUDA MITSUO7 citations82

TOMIMATSU SATOSHI

2 patents
US8569719B2Oct 29, 2013

Method and apparatus for specimen fabrication

TOMIMATSU SATOSHI6 citations83
US8405053B2Mar 26, 2013

Method and apparatus for specimen fabrication

TOMIMATSU SATOSHI4 citations72

HITACHI HIGH-TECH SCIENCE CORP

1 patent
US9620333B2Apr 11, 2017

Charged particle beam apparatus

HITACHI HIGH-TECH SCIENCE CORP9 citations84

OHSHIMA TAKASHI

1 patent
US8450699B2May 28, 2013

Electron beam device and electron beam application device using the same

OHSHIMA TAKASHI10 citations83

KITAYAMA SHINYA

1 patent
US9202672B2Dec 1, 2015

Apparatus and method for probe shape processing by ion beam

KITAYAMA SHINYA12 citations80

HITACHI HIGH TECH SCIENCE CORP

1 patent
US10236159B2Mar 19, 2019

Charged particle beam apparatus

HITACHI HIGH TECH SCIENCE CORP3 citations73

Showing the top 50 of 72 patents by PatentIndex Score.