Inventor
MADOKORO YUICHI
JP27 patents
⚠️ This page may combine multiple inventors who share the name “MADOKORO YUICHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI LTD
14 patentsUS6538254B1Mar 25, 2003
Method and apparatus for sample fabrication
HITACHI LTD315 citations99
US7071475B2Jul 4, 2006
Method and apparatus for specimen fabrication
HITACHI LTD61 citations97
US6828566B2Dec 7, 2004
Method and apparatus for specimen fabrication
HITACHI LTD62 citations97
US7138628B2Nov 21, 2006
Method and apparatus for specimen fabrication
HITACHI LTD35 citations96
US6822245B2Nov 23, 2004
Ion beam apparatus and sample processing method
HITACHI LTD60 citations96
US7525108B2Apr 28, 2009
Focused ion beam apparatus for specimen fabrication
HITACHI LTD16 citations93
US7397052B2Jul 8, 2008
Method and apparatus for specimen fabrication
HITACHI LTD16 citations93
US7397050B2Jul 8, 2008
Method and apparatus for specimen fabrication
HITACHI LTD16 citations93
US7176458B2Feb 13, 2007
Method and apparatus for specimen fabrication
HITACHI LTD18 citations93
US7084399B2Aug 1, 2006
Ion beam apparatus and sample processing method
HITACHI LTD52 citations92
US7397051B2Jul 8, 2008
Method and apparatus for specimen fabrication
HITACHI LTD8 citations82
US7999240B2Aug 16, 2011
Method and apparatus for specimen fabrication
HITACHI LTD4 citations74
US7791050B2Sep 7, 2010
Method and apparatus for specimen fabrication
HITACHI LTD4 citations74
US5910871AJun 8, 1999
Magnetic head having track width specified by grooves formed with projection ion beam
HITACHI LTD16 citations74
HITACHI HIGH TECH CORP
7 patentsUS7005651B2Feb 28, 2006
Liquid metal ion gun
HITACHI HIGH TECH CORP12 citations92
US7420181B2Sep 2, 2008
Liquid metal ion gun
HITACHI HIGH TECH CORP10 citations84
US7804073B2Sep 28, 2010
Liquid metal ion gun
HITACHI HIGH TECH CORP5 citations73
US7211805B2May 1, 2007
Liquid metal ion gun
HITACHI HIGH TECH CORP8 citations73
US7189982B2Mar 13, 2007
Focused ion beam apparatus and aperture
HITACHI HIGH TECH CORP8 citations73
US7235798B2Jun 26, 2007
Focused ion beam apparatus
HITACHI HIGH TECH CORP4 citations63
US7435972B2Oct 14, 2008
Focused ion beam apparatus and liquid metal ion source
HITACHI HIGH TECH CORP2 citations62
MADOKORO YUICHI
3 patentsUS8629394B2Jan 14, 2014
Charged particle beam device and method for correcting position with respect to charged particle beam
MADOKORO YUICHI9 citations80
US8552397B2Oct 8, 2013
Focused ion beam device and focused ion beam processing method
MADOKORO YUICHI3 citations55
US8710464B2Apr 29, 2014
Specimen preparation device, and control method in specimen preparation device
MADOKORO YUICHI0 citations48