Inventor
KURVATHODIL MANOJ
AT2 patents
Patents
2 patentsUS11579280B2Feb 14, 2023
Phase, phase noise, and slave mode measurement for millimeter wave integrated circuits on automatic test equipment
INFINEON TECHNOLOGIES AG3 citations68
US10673545B1Jun 2, 2020
Noise measurement for integrated circuit device with on-device test signal up-conversion
INFINEON TECHNOLOGIES AG5 citations63