Inventor
SHIEH MING-FENG
TW117 patents
⚠️ This page may combine multiple inventors who share the name “SHIEH MING-FENG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG
23 patentsUS9153478B2Oct 6, 2015
Spacer etching process for integrated circuit design
TAIWAN SEMICONDUCTOR MFG118 citations99
US8039179B2Oct 18, 2011
Integrated circuit layout design
TAIWAN SEMICONDUCTOR MFG121 citations99
US8975129B1Mar 10, 2015
Method of making a FinFET device
TAIWAN SEMICONDUCTOR MFG60 citations98
US7989355B2Aug 2, 2011
Method of pitch halving
TAIWAN SEMICONDUCTOR MFG58 citations98
US7862962B2Jan 4, 2011
Integrated circuit layout design
TAIWAN SEMICONDUCTOR MFG46 citations98
US9177797B2Nov 3, 2015
Lithography using high selectivity spacers for pitch reduction
TAIWAN SEMICONDUCTOR MFG28 citations94
US9153483B2Oct 6, 2015
Method of semiconductor integrated circuit fabrication
TAIWAN SEMICONDUCTOR MFG28 citations94
US9034723B1May 19, 2015
Method of making a FinFET device
TAIWAN SEMICONDUCTOR MFG28 citations94
US8846490B1Sep 30, 2014
Method of fabricating a FinFET device
TAIWAN SEMICONDUCTOR MFG37 citations94
US8962464B1Feb 24, 2015
Self-alignment for using two or more layers and methods of forming same
TAIWAN SEMICONDUCTOR MFG16 citations93
US8835323B1Sep 16, 2014
Method for integrated circuit patterning
TAIWAN SEMICONDUCTOR MFG22 citations93
US9368594B2Jun 14, 2016
Method of forming a fin-like BJT
TAIWAN SEMICONDUCTOR MFG11 citations84
US9362132B2Jun 7, 2016
Systems and methods for a sequential spacer scheme
TAIWAN SEMICONDUCTOR MFG4 citations84
US9245763B2Jan 26, 2016
Mechanisms for forming patterns using multiple lithography processes
TAIWAN SEMICONDUCTOR MFG6 citations84
US9136106B2Sep 15, 2015
Method for integrated circuit patterning
TAIWAN SEMICONDUCTOR MFG11 citations84
US9054159B2Jun 9, 2015
Method of patterning a feature of a semiconductor device
TAIWAN SEMICONDUCTOR MFG7 citations84
US8932957B2Jan 13, 2015
Method of fabricating a FinFET device
TAIWAN SEMICONDUCTOR MFG18 citations84
US8871597B2Oct 28, 2014
High gate density devices and methods
TAIWAN SEMICONDUCTOR MFG7 citations84
US8847295B2Sep 30, 2014
Structure and method for fabricating fin devices
TAIWAN SEMICONDUCTOR MFG13 citations84
US8828885B2Sep 9, 2014
Photo resist trimmed line end space
TAIWAN SEMICONDUCTOR MFG5 citations84
US8806397B2Aug 12, 2014
Method and device for increasing fin device density for unaligned fins
TAIWAN SEMICONDUCTOR MFG5 citations84
US9252021B2Feb 2, 2016
Method for patterning a plurality of features for Fin-like field-effect transistor (FinFET) devices
TAIWAN SEMICONDUCTOR MFG11 citations83
US9023695B2May 5, 2015
Method of patterning features of a semiconductor device
TAIWAN SEMICONDUCTOR MFG11 citations82
TAIWAN SEMICONDUCTOR MFG CO LTD
13 patentsUS9576814B2Feb 21, 2017
Method of spacer patterning to form a target integrated circuit pattern
TAIWAN SEMICONDUCTOR MFG CO LTD3,080 citations99
US9773676B2Sep 26, 2017
Lithography using high selectivity spacers for pitch reduction
TAIWAN SEMICONDUCTOR MFG CO LTD17 citations93
US10014175B2Jul 3, 2018
Lithography using high selectivity spacers for pitch reduction
TAIWAN SEMICONDUCTOR MFG CO LTD7 citations84
US9437415B2Sep 6, 2016
Layer alignment in FinFET fabrication
TAIWAN SEMICONDUCTOR MFG CO LTD13 citations84
US10096519B2Oct 9, 2018
Method of making a FinFET device
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations83
US9437497B2Sep 6, 2016
Method of making a FinFET device
TAIWAN SEMICONDUCTOR MFG CO LTD8 citations80
US11239365B2Feb 1, 2022
Structure and method for providing line end extensions for fin-type active regions
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US11037882B2Jun 15, 2021
Overlay mark
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US10770303B2Sep 8, 2020
Mechanisms for forming patterns using multiple lithography processes
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US10672656B2Jun 2, 2020
Method of semiconductor integrated circuit fabrication
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations73
US10573751B2Feb 25, 2020
Structure and method for providing line end extensions for fin-type active regions
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US10276363B2Apr 30, 2019
Mechanisms for forming patterns using multiple lithography processes
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
US10249570B2Apr 2, 2019
Overlay mark
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations73
SHIEH MING-FENG
5 patentsUS8110466B2Feb 7, 2012
Cross OD FinFET patterning
SHIEH MING-FENG44 citations94
US8881066B2Nov 4, 2014
Mandrel modification for achieving single fin fin-like field effect transistor (FinFET) device
SHIEH MING-FENG21 citations92
US8735991B2May 27, 2014
High gate density devices and methods
SHIEH MING-FENG24 citations92
US8796156B2Aug 5, 2014
Cross OD FinFET patterning
SHIEH MING-FENG5 citations84
US8241823B2Aug 14, 2012
Method of fabrication of a semiconductor device having reduced pitch
SHIEH MING-FENG11 citations84
WANN CLEMENT HSINGJEN
2 patentsDE HO WEI
2 patentsWANG CHIEN-HSUN
2 patentsYU SHAO-MING
1 patentCHANG CHIH-SHENG
1 patentCHEN CHEN-YU
1 patentShowing the top 50 of 117 patents by PatentIndex Score.