Inventor
REGENSBURGER MENACHEM
IL15 patents
⚠️ This page may combine multiple inventors who share the name “REGENSBURGER MENACHEM”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
CAMTEK LTD
7 patentsUS10497092B2Dec 3, 2019
Continuous light inspection
CAMTEK LTD2 citations70
US11828713B1Nov 28, 2023
Semiconductor inspection tool system and method for wafer edge inspection
CAMTEK LTD4 citations67
US9756313B2Sep 5, 2017
High throughput and low cost height triangulation system and method
CAMTEK LTD4 citations65
US12320757B2Jun 3, 2025
Semiconductor inspection tool system and method for wafer edge inspection
CAMTEK LTD0 citations55
US11300521B2Apr 12, 2022
Automatic defect classification
CAMTEK LTD0 citations48
US10732128B2Aug 4, 2020
Hierarchical wafer inspection
CAMTEK LTD0 citations39
US10598607B2Mar 24, 2020
Objective lens
CAMTEK LTD0 citations35
POSTOLOV YURI
5 patentsUS8238645B2Aug 7, 2012
Inspection system and a method for detecting defects based upon a reference frame
POSTOLOV YURI2 citations57
US8233699B2Jul 31, 2012
Inspection system and a method for detecting defects based upon a reference frame
POSTOLOV YURI1 citations57
US10203289B2Feb 12, 2019
Inspection system and a method for inspecting a diced wafer
POSTOLOV YURI0 citations46
US10042974B2Aug 7, 2018
Inspecting a wafer using image and design information
POSTOLOV YURI0 citations36
US8208713B2Jun 26, 2012
Method and system for inspecting a diced wafer
POSTOLOV YURI0 citations36