Inventor
KOTAKE Yasuyo
JP4 patents
Patents
4 patentsUS9892504B2Feb 13, 2018
Image inspection method and inspection region setting method
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US11113804B2Sep 7, 2021
Quality estimation device, quality estimation method, and quality estimation program
OMRON TATEISI ELECTRONICS CO2 citations66
US11341770B2May 24, 2022
Facial image identification system, identifier generation device, identification device, image identification system, and identification system
OMRON TATEISI ELECTRONICS CO1 citations55
US11834052B2Dec 5, 2023
Estimator generation apparatus, monitoring apparatus, estimator generation method, and computer-readable storage medium storing estimator generation program
OMRON TATEISI ELECTRONICS CO0 citations47