Inventor

RANJAN MANISH

US21 patents

⚠️ This page may combine multiple inventors who share the name “RANJAN MANISH”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

RANJAN MANISH

LAM RES CORP

Methods and apparatuses for estimating on-wafer oxide layer reduction effectiveness via color sensing

Systems and methods for controlling substrate approach toward a target horizontal plane

Methods and apparatuses for estimating on-wafer oxide layer reduction effectiveness via color sensing

Systems and methods for controlling substrate approach toward a target horizontal plane

Monitoring surface oxide on seed layers during electroplating

Monitoring surface oxide on seed layers during electroplating

Systems and methods for in-situ measurement of sheet resistance on substrates

Improving substrate wettability for plating operations

Electrochemical deposition system including optical probes

ASML NETHERLANDS BV

Lithographic apparatus and method with improved contaminant particle capture

Lithographic apparatus and device manufacturing method

Apparatus and method for determining a condition associated with a pellicle

Lithographic apparatus and device manufacturing method

NOVELLUS SYSTEMS INC

Wetting wave front control for reduced air entrapment during wafer entry into electroplating bath

Wetting wave front control for reduced air entrapment during wafer entry into electroplating bath

NIENHUYS HAN-KWANG

Lithographic apparatus and device manufacturing method

Lithographic apparatus and device manufacturing method

RANJAN MANISH

Wetting wave front control for reduced air entrapment during wafer entry into electroplating bath

DHANIJALA SURESH

Miniature ultrafine particle sensor

HAWRYLUK ANDREW M

Sub-field enhanced global alignment

ASML HOLDING NV

Lithographic system provided with a deflection apparatus for changing a trajectory of particulate debris