Inventor
DE KAUSHIK
US17 patents
⚠️ This page may combine multiple inventors who share the name “DE KAUSHIK”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SYNOPSYS INC
11 patentsUS7797123B2Sep 14, 2010
Method and apparatus for extracting assume properties from a constrained random test-bench
SYNOPSYS INC10 citations80
US10878153B1Dec 29, 2020
Apparatuses and methods for accurate and efficient clock domain and reset domain verification with register transfer level memory inference
SYNOPSYS INC9 citations79
US11467851B1Oct 11, 2022
Machine learning (ML)-based static verification for derived hardware-design elements
SYNOPSYS INC3 citations72
US9529948B2Dec 27, 2016
Minimizing crossover paths for functional verification of a circuit description
SYNOPSYS INC5 citations70
US11550979B2Jan 10, 2023
Implementing and verifying safety measures in a system design based on safety specification generated from safety requirements
SYNOPSYS INC2 citations60
US9032339B2May 12, 2015
Ranking verification results for root cause analysis
SYNOPSYS INC3 citations59
US11222154B2Jan 11, 2022
State table complexity reduction in a hierarchical verification flow
SYNOPSYS INC0 citations56
US11947885B1Apr 2, 2024
Low-power static signoff verification from within an implementation tool
SYNOPSYS INC0 citations55
US9792394B2Oct 17, 2017
Accurate glitch detection
SYNOPSYS INC1 citations46
US10706192B1Jul 7, 2020
Voltage reconciliation in multi-level power managed systems
SYNOPSYS INC0 citations41
US9886753B2Feb 6, 2018
Verification of circuit structures including sub-structure variants
SYNOPSYS INC0 citations34
LSI LOGIC CORP
5 patentsUS6135647AOct 24, 2000
System and method for representing a system level RTL design using HDL independent objects and translation to synthesizable RTL code
LSI LOGIC CORP83 citations96
US5663967ASep 2, 1997
Defect isolation using scan-path testing and electron beam probing in multi-level high density asics
LSI LOGIC CORP99 citations92
US5638380AJun 10, 1997
Protecting proprietary asic design information using boundary scan on selective inputs and outputs
LSI LOGIC CORP24 citations92
US5903578AMay 11, 1999
Test shells for protecting proprietary information in asic cores
LSI LOGIC CORP23 citations91
US6212655B1Apr 3, 2001
IDDQ test solution for large asics
LSI LOGIC CORP7 citations67