Inventor
RAVID ABRAHAM
US22 patents
⚠️ This page may combine multiple inventors who share the name “RAVID ABRAHAM”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
APPLIED MATERIALS INC
16 patentsUS7444198B2Oct 28, 2008
Determining physical property of substrate
APPLIED MATERIALS INC17 citations92
US7952708B2May 31, 2011
High throughput measurement system
APPLIED MATERIALS INC13 citations84
US7840375B2Nov 23, 2010
Methods and apparatus for generating a library of spectra
APPLIED MATERIALS INC12 citations84
US9405287B1Aug 2, 2016
Apparatus and method for optical calibration of wafer placement by a robot
APPLIED MATERIALS INC11 citations83
US7746485B2Jun 29, 2010
Determining physical property of substrate
APPLIED MATERIALS INC6 citations74
US10565701B2Feb 18, 2020
Color imaging for CMP monitoring
APPLIED MATERIALS INC3 citations73
US11430680B2Aug 30, 2022
Position and temperature monitoring of ALD platen susceptor
APPLIED MATERIALS INC2 citations72
US10312120B2Jun 4, 2019
Position and temperature monitoring of ALD platen susceptor
APPLIED MATERIALS INC4 citations72
US10196741B2Feb 5, 2019
Wafer placement and gap control optimization through in situ feedback
APPLIED MATERIALS INC3 citations72
US10260855B2Apr 16, 2019
Electroplating tool with feedback of metal thickness distribution and correction
APPLIED MATERIALS INC2 citations70
US8014004B2Sep 6, 2011
Determining physical property of substrate
APPLIED MATERIALS INC4 citations63
US11715193B2Aug 1, 2023
Color imaging for CMP monitoring
APPLIED MATERIALS INC0 citations62
US11119051B2Sep 14, 2021
Particle detection for substrate processing
APPLIED MATERIALS INC0 citations62
US9631919B2Apr 25, 2017
Non-contact sheet resistance measurement of barrier and/or seed layers prior to electroplating
APPLIED MATERIALS INC1 citations62
US10845317B2Nov 24, 2020
Particle detection for substrate processing
APPLIED MATERIALS INC0 citations51
US9490154B2Nov 8, 2016
Method of aligning substrate-scale mask with substrate
APPLIED MATERIALS INC1 citations51
RAVID ABRAHAM
4 patentsUS8452077B2May 28, 2013
Method for imaging workpiece surfaces at high robot transfer speeds with correction of motion-induced distortion
RAVID ABRAHAM4 citations58
US8698889B2Apr 15, 2014
Metrology system for imaging workpiece surfaces at high robot transfer speeds
RAVID ABRAHAM3 citations57
US9880233B2Jan 30, 2018
Methods and apparatus to determine parameters in metal-containing films
RAVID ABRAHAM1 citations50
US8620064B2Dec 31, 2013
Method for imaging workpiece surfaces at high robot transfer speeds with reduction or prevention of motion-induced distortion
RAVID ABRAHAM0 citations37