Inventor

JEONG YOO JIN

KR2 patents

Patents

2 patents

US10115640B2Oct 30, 2018

Method of manufacturing integrated circuit device

SAMSUNG ELECTRONICS CO LTD7 citations80

US10474133B2Nov 12, 2019

Inspection device for inspecting wafer and method of inspecting wafer using the same

SAMSUNG ELECTRONICS CO LTD3 citations69