Inventor

HUANG I-CHE

TW2 patents

Patents

2 patents

US9064823B2Jun 23, 2015

Method for qualifying a semiconductor wafer for subsequent processing

TAIWAN SEMICONDUCTOR MFG CO LTD3 citations58

US10141413B2Nov 27, 2018

Wafer strength by control of uniformity of edge bulk micro defects

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations37