Inventor

YPMA ALEXANDER

NL36 patents

⚠️ This page may combine multiple inventors who share the name “YPMA ALEXANDER”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

YPMA ALEXANDER

ASML NETHERLANDS BV

Methods and apparatus for obtaining diagnostic information relating to an industrial process

Methods and apparatus for obtaining diagnostic information relating to an industrial process

Methods and apparatus for obtaining diagnostic information relating to an industrial process

Methods and apparatus for obtaining diagnostic information relating to an industrial process

Method and apparatus for controlling an industrial process using product grouping

Lithographic apparatus and device manufacturing method

Lithography system and a machine learning controller for such a lithography system

Generating predicted data for control or monitoring of a production process

Methods of determining corrections for a patterning process

Methods and apparatus for obtaining diagnostic information relating to an industrial process

Methods and apparatus for obtaining diagnostic information relating to an industrial process

Methods and apparatus for obtaining diagnostic information, methods and apparatus for controlling an industrial process

Method to label substrates based on process parameters

Method and apparatus for optimization of lithographic process

Method and apparatus for optimization of lithographic process

Methods of determining corrections for a patterning process, device manufacturing method, control system for a lithographic apparatus and lithographic apparatus

Method to predict yield of a device manufacturing process

Methods of determining corrections for a patterning process, device manufacturing method, control system for a lithographic apparatus and lithographic apparatus

Methods of determining corrections for a patterning process, device manufacturing method, control system for a lithographic apparatus and lithographic apparatus

Method to label substrates based on process parameters

Method to predict yield of a device manufacturing process

Method of operating a lithographic apparatus, device manufacturing method and associated data processing apparatus and computer program product

Apparatus and method for property joint interpolation and prediction

Maintaining a set of process fingerprints

Optimizing an apparatus for multi-stage processing of product units

Optimizing an apparatus for multi-stage processing of product units

Methods of modelling systems for performing predictive maintenance of systems, such as lithographic systems

Extracting a feature from a data set

Method for determining an inspection strategy for a group of substrates in a semiconductor manufacturing process

Method for adjusting a patterning process

DE VRIES AALBERT

Optimization of hearing aid parameters

Efficient evaluation of hearing ability

GN RESOUND AS

Method and apparatus for improved estimation of non-stationary noise for speech enhancement

Learning control of hearing aid parameter settings

YPMA ALEXANDER

Asymmetric adjustment

Learning control of hearing aid parameter settings