P

Inventor

TAKEUCHI NOBUAKI

JP22 patents
⚠️ This page may combine multiple inventors who share the name “TAKEUCHI NOBUAKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ANDO ELECTRIC

21 patents
US6028661AFeb 22, 2000

Multi-branched optical line testing apparatus

ANDO ELECTRIC57 citations94
US5452071ASep 19, 1995

Method of measuring optical attenuation using an optical time domain reflectometer

ANDO ELECTRIC21 citations92
US5309455AMay 3, 1994

High-power light pulse generating apparatus

ANDO ELECTRIC34 citations92
US6512610B1Jan 28, 2003

Device and method for testing of multi-branch optical network

ANDO ELECTRIC53 citations91
US6310702B1Oct 30, 2001

Testing device for multistage multi-branch optical network

ANDO ELECTRIC44 citations90
US6567760B1May 20, 2003

Electro-optic sampling oscilloscope

ANDO ELECTRIC17 citations83
US6473556B1Oct 29, 2002

Apparatus for inspecting integrated circuits

ANDO ELECTRIC11 citations73
US6384590B1May 7, 2002

Light receiving circuit for use in electro-optic sampling oscilloscope

ANDO ELECTRIC13 citations73
US6232765B1May 15, 2001

Electro-optical oscilloscope with improved sampling

ANDO ELECTRIC8 citations73
US6201235B1Mar 13, 2001

Electro-optic sampling oscilloscope

ANDO ELECTRIC14 citations73
US6310507B1Oct 30, 2001

Timing generation circuit for electro-optic sampling oscilloscope

ANDO ELECTRIC7 citations72
US6766483B2Jul 20, 2004

Semiconductor test apparatus

ANDO ELECTRIC4 citations62
US6614252B2Sep 2, 2003

Semiconductor test apparatus with reduced power consumption and heat generation

ANDO ELECTRIC2 citations62
US6566896B2May 20, 2003

Semiconductor testing apparatus

ANDO ELECTRIC2 citations62
US6486952B2Nov 26, 2002

Semiconductor test apparatus

ANDO ELECTRIC3 citations62
US6087838AJul 11, 2000

Signal processing circuit for electro-optic probe

ANDO ELECTRIC2 citations62
US6377036B1Apr 23, 2002

Electro-optic sampling oscilloscope

ANDO ELECTRIC2 citations61
US6288529B1Sep 11, 2001

Timing generation circuit for an electro-optic oscilloscope

ANDO ELECTRIC4 citations60
US6505312B1Jan 7, 2003

Integrated circuit tester

ANDO ELECTRIC6 citations57
US6252387B1Jun 26, 2001

Oscilloscope utilizing probe with electro-optic crystal

ANDO ELECTRIC1 citations51
US6683447B1Jan 27, 2004

Electro-optic apparatus for measuring signal potentials

ANDO ELECTRIC0 citations40

YOKOGAWA ELECTRIC CORP

1 patent