Inventor
KURIBARA MASAYUKI
JP10 patents
⚠️ This page may combine multiple inventors who share the name “KURIBARA MASAYUKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ADVANTEST CORP
9 patentsUS5592099AJan 7, 1997
IC tester joined with ion beam tester and the detection method of the failure part of IC
ADVANTEST CORP20 citations90
US5528156AJun 18, 1996
IC analysis system and electron beam probe system and fault isolation method therefor
ADVANTEST CORP27 citations90
US6326798B1Dec 4, 2001
Electric beam tester and image processing apparatus
ADVANTEST CORP7 citations72
US5633595AMay 27, 1997
IC analysis system and electron beam probe system and fault isolation method therefor
ADVANTEST CORP11 citations71
US5589780ADec 31, 1996
IC Analysis system and electron beam probe system and fault isolation method therefor
ADVANTEST CORP11 citations71
US7663103B2Feb 16, 2010
Line-width measurement adjusting method and scanning electron microscope
ADVANTEST CORP3 citations62
US7560693B2Jul 14, 2009
Electron-beam size measuring apparatus and size measuring method with electron beams
ADVANTEST CORP2 citations61
US6445197B1Sep 3, 2002
Electron beam tester, recording medium therefor and signal data detecting method
ADVANTEST CORP0 citations40
US7262410B2Aug 28, 2007
Sample observing apparatus and sample observing method
ADVANTEST CORP0 citations39