Inventor
ISHIO SEIICHIRO
JP28 patents
⚠️ This page may combine multiple inventors who share the name “ISHIO SEIICHIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
DENSO CORP
27 patentsUS7355388B2Apr 8, 2008
Rotation detecting device using magnetic sensor
DENSO CORP64 citations98
US6422088B1Jul 23, 2002
Sensor failure or abnormality detecting system incorporated in a physical or dynamic quantity detecting apparatus
DENSO CORP142 citations98
US6065341AMay 23, 2000
Semiconductor physical quantity sensor with stopper portion
DENSO CORP130 citations98
US6744258B2Jun 1, 2004
Capacitive sensor apparatus
DENSO CORP63 citations96
US6199430B1Mar 13, 2001
Acceleration sensor with ring-shaped movable electrode
DENSO CORP77 citations96
US6925885B2Aug 9, 2005
Pressure sensor
DENSO CORP21 citations93
US6521966B1Feb 18, 2003
Semiconductor strain sensor
DENSO CORP37 citations93
US6495389B2Dec 17, 2002
Method for manufacturing semiconductor pressure sensor having reference pressure chamber
DENSO CORP32 citations93
US6270685B1Aug 7, 2001
Method for producing a semiconductor
DENSO CORP23 citations93
US6789431B2Sep 14, 2004
Diaphragm-type semiconductor pressure sensor
DENSO CORP20 citations92
US6694814B2Feb 24, 2004
Dynamic sensor having capacitance varying according to dynamic force applied thereto
DENSO CORP26 citations92
US6653702B2Nov 25, 2003
Semiconductor pressure sensor having strain gauge and circuit portion on semiconductor substrate
DENSO CORP24 citations92
US6640643B2Nov 4, 2003
Capacitive pressure sensor with multiple capacitive portions
DENSO CORP27 citations92
US5869876AFeb 9, 1999
Semiconductor strain sensor
DENSO CORP27 citations92
US6448624B1Sep 10, 2002
Semiconductor acceleration sensor
DENSO CORP47 citations91
US6897669B2May 24, 2005
Semiconductor device having bonding pads and probe pads
DENSO CORP17 citations84
US7141966B2Nov 28, 2006
Rotation detecting apparatus
DENSO CORP14 citations83
US6802222B2Oct 12, 2004
Diaphragm-type semiconductor device and method for manufacturing diaphragm-type semiconductor device
DENSO CORP16 citations83
US7253601B2Aug 7, 2007
Current sensor having hall element
DENSO CORP9 citations74
US6875673B2Apr 5, 2005
Method of producing semiconductor device
DENSO CORP7 citations74
US6686634B2Feb 3, 2004
Semiconductor device and a method of producing the same
DENSO CORP9 citations74
US6143584ANov 7, 2000
Method for fabrication of a semiconductor sensor
DENSO CORP12 citations74
US6130010AOct 10, 2000
Method for producing a semiconductor dynamic sensor using an anisotropic etching mask
DENSO CORP8 citations74
US7105910B2Sep 12, 2006
Semiconductor device having SOI construction
DENSO CORP9 citations73
US6933582B2Aug 23, 2005
Semiconductor sensor having a diffused resistor
DENSO CORP11 citations73
US6809527B2Oct 26, 2004
Method of measuring a characteristic of a capacitive type of sensor, a sensor characteristic measuring apparatus, a capacitive type of sensor apparatus, and an ic chip for measuring a sensor characteristic
DENSO CORP7 citations73
US6647795B2Nov 18, 2003
Capacitive physical load sensor and detection system
DENSO CORP6 citations62