Inventor
TALANOV VLADIMIR V
US15 patents
⚠️ This page may combine multiple inventors who share the name “TALANOV VLADIMIR V”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NEOCERA INC
5 patentsUS6856140B2Feb 15, 2005
System and method for quantitative measurements of a material's complex permittivity with use of near-field microwave probes
NEOCERA INC25 citations90
US6680617B2Jan 20, 2004
Apertured probes for localized measurements of a material's complex permittivity and fabrication method
NEOCERA INC27 citations90
US6959481B2Nov 1, 2005
Apertured probes for localized measurements of a material's complex permittivity and fabrication method
NEOCERA INC12 citations82
US7102363B2Sep 5, 2006
Method and system for non-contact measurement of microwave capacitance of miniature structures of integrated circuits
NEOCERA INC7 citations61
US6943562B2Sep 13, 2005
Method and system for non-contact measurement of microwave capacitance of miniature structures of integrated circuits
NEOCERA INC5 citations61
MICROSOFT TECHNOLOGY LICENSING LLC
2 patentsSOLID STATE MEASUREMENTS INC
2 patentsUS7285963B2Oct 23, 2007
Method and system for measurement of dielectric constant of thin films using a near field microwave probe
SOLID STATE MEASUREMENTS INC19 citations81
US7362108B2Apr 22, 2008
Method and system for measurement of sidewall damage in etched dielectric structures using a near field microwave probe
SOLID STATE MEASUREMENTS INC2 citations60