Inventor
CHAU ROBERT
US73 patents
⚠️ This page may combine multiple inventors who share the name “CHAU ROBERT”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INTEL CORP
44 patentsUS7662689B2Feb 16, 2010
Strained transistor integration for CMOS
INTEL CORP343 citations99
US7348284B2Mar 25, 2008
Non-planar pMOS structure with a strained channel region and an integrated strained CMOS flow
INTEL CORP141 citations99
US7268058B2Sep 11, 2007
Tri-gate transistors and methods to fabricate same
INTEL CORP164 citations99
US6897098B2May 24, 2005
Method of fabricating an ultra-narrow channel semiconductor device
INTEL CORP226 citations99
US6696345B2Feb 24, 2004
Metal-gate electrode for CMOS transistor applications
INTEL CORP164 citations99
US6617209B1Sep 9, 2003
Method for making a semiconductor device having a high-k gate dielectric
INTEL CORP132 citations99
US7531393B2May 12, 2009
Non-planar MOS structure with a strained channel region
INTEL CORP121 citations98
US7494862B2Feb 24, 2009
Methods for uniform doping of non-planar transistor structures
INTEL CORP70 citations98
US7193279B2Mar 20, 2007
Non-planar MOS structure with a strained channel region
INTEL CORP76 citations98
US6974733B2Dec 13, 2005
Double-gate transistor with enhanced carrier mobility
INTEL CORP95 citations98
US6890807B2May 10, 2005
Method for making a semiconductor device having a metal gate electrode
INTEL CORP67 citations98
US6620713B2Sep 16, 2003
Interfacial layer for gate electrode and high-k dielectric layer and methods of fabrication
INTEL CORP80 citations98
US6617210B1Sep 9, 2003
Method for making a semiconductor device having a high-k gate dielectric
INTEL CORP127 citations98
US7071064B2Jul 4, 2006
U-gate transistors and methods of fabrication
INTEL CORP96 citations97
US7223679B2May 29, 2007
Transistor gate electrode having conductor material layer
INTEL CORP34 citations96
US6900481B2May 31, 2005
Non-silicon semiconductor and high-k gate dielectric metal oxide semiconductor field effect transistors
INTEL CORP64 citations96
US6610615B1Aug 26, 2003
Plasma nitridation for reduced leakage gate dielectric layers
INTEL CORP127 citations96
US7968957B2Jun 28, 2011
Transistor gate electrode having conductor material layer
INTEL CORP11 citations93
US7851790B2Dec 14, 2010
Isolated Germanium nanowire on Silicon fin
INTEL CORP43 citations93
US7473947B2Jan 6, 2009
Process for ultra-thin body SOI devices that incorporate EPI silicon tips and article made thereby
INTEL CORP20 citations93
US7145246B2Dec 5, 2006
Method of fabricating an ultra-narrow channel semiconductor device
INTEL CORP32 citations93
US7045073B2May 16, 2006
Pre-etch implantation damage for the removal of thin film layers
INTEL CORP22 citations93
US6998686B2Feb 14, 2006
Metal-gate electrode for CMOS transistor applications
INTEL CORP23 citations93
US7960794B2Jun 14, 2011
Non-planar pMOS structure with a strained channel region and an integrated strained CMOS flow
INTEL CORP20 citations92
US5488003AJan 30, 1996
Method of making emitter trench BiCMOS using integrated dual layer emitter mask
INTEL CORP26 citations92
US6667251B2Dec 23, 2003
Plasma nitridation for reduced leakage gate dielectric layers
INTEL CORP29 citations90
US10541305B2Jan 21, 2020
Group III-N nanowire transistors
INTEL CORP4 citations84
US10186581B2Jan 22, 2019
Group III-N nanowire transistors
INTEL CORP4 citations84
US9666492B2May 30, 2017
CMOS implementation of germanium and III-V nanowires and nanoribbons in gate-all-around architecture
INTEL CORP6 citations84
US9397188B2Jul 19, 2016
Group III-N nanowire transistors
INTEL CORP7 citations84
US8872225B2Oct 28, 2014
Defect transferred and lattice mismatched epitaxial film
INTEL CORP12 citations84
US7936025B2May 3, 2011
Metalgate electrode for PMOS transistor
INTEL CORP13 citations84
US7608883B2Oct 27, 2009
Transistor for non volatile memory devices having a carbon nanotube channel and electrically floating quantum dots in its gate dielectric
INTEL CORP13 citations84
US7422971B2Sep 9, 2008
Process for ultra-thin body SOI devices that incorporate EPI silicon tips and article made thereby
INTEL CORP10 citations84
US7342277B2Mar 11, 2008
Transistor for non volatile memory devices having a carbon nanotube channel and electrically floating quantum dots in its gate dielectric
INTEL CORP13 citations84
US7166505B2Jan 23, 2007
Method for making a semiconductor device having a high-k gate dielectric
INTEL CORP11 citations84
US7566898B2Jul 28, 2009
Buffer architecture formed on a semiconductor wafer
INTEL CORP17 citations83
US7531404B2May 12, 2009
Semiconductor device having a metal gate electrode formed on an annealed high-k gate dielectric layer
INTEL CORP16 citations83
US9029835B2May 12, 2015
Epitaxial film on nanoscale structure
INTEL CORP13 citations82
US7671414B2Mar 2, 2010
Semiconductor on insulator apparatus
INTEL CORP5 citations74
US7642610B2Jan 5, 2010
Transistor gate electrode having conductor material layer
INTEL CORP7 citations74
US7427538B2Sep 23, 2008
Semiconductor on insulator apparatus and method
INTEL CORP5 citations74
US6809017B2Oct 26, 2004
Interfacial layer for gate electrode and high-k dielectric layer and methods of fabrication
INTEL CORP8 citations74
US10784170B2Sep 22, 2020
CMOS implementation of germanium and III-V nanowires and nanoribbons in gate-all-around architecture
INTEL CORP3 citations73
THEN HAN WUI
3 patentsRADOSAVLJEVIC MARKO
1 patentRACHMADY WILLY
1 patentPILLARISETTY RAVI
1 patentShowing the top 50 of 73 patents by PatentIndex Score.