Inventor

COUTURIER ROBERT A

2 patents

Patents

2 patents

US4039751AAug 2, 1977

Method and apparatus for closed loop testing of first and second modulators and demodulators

GEN DATACOMM IND INC17 citations68

US3952163AApr 20, 1976

Method and apparatus for testing in FDM system

GEN DATACOMM IND INC13 citations68