Inventor

NISHIHASHI RYOUJI

JP2 patents

⚠️ This page may combine multiple inventors who share the name “NISHIHASHI RYOUJI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

RENESAS TECH CORP

1 patent

US6972202B2Dec 6, 2005

Method of manufacturing and testing a semiconductor device

RENESAS TECH CORP9 citations70

MITSUBISHI ELECTRIC CORP

1 patent

US4904934AFeb 27, 1990

Testing apparatus for semiconductor devices

MITSUBISHI ELECTRIC CORP15 citations68