Inventor
ARMSTRONG JASON N
US2 patents
Patents
2 patentsUS8397311B2Mar 12, 2013
Metrology probe and method of configuring a metrology probe
CHOPRA HARSH DEEP0 citations38
US7425826B2Sep 16, 2008
Selectively conductive structure wherein a magnetic conductor is sized to have a cross-section diameter similar to a Fermi wavelength of electrons
CHOPRA HARSH DEEP0 citations35