P

Inventor

LEE I-CHE

TW18 patents
⚠️ This page may combine multiple inventors who share the name “LEE I-CHE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TAIWAN SEMICONDUCTOR MFG CO LTD

15 patents
US12040018B2Jul 16, 2024

Method for programming memory

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US11527289B2Dec 13, 2022

Method for programming memory

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US11404477B2Aug 2, 2022

Memory array and method of forming thereof

TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US12417806B2Sep 16, 2025

Method for programming memory

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12412787B2Sep 9, 2025

Manufacturing process with atomic level inspection

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12281991B2Apr 22, 2025

Inspection layer to improve the detection of defects through optical systems and methods of inspecting semiconductor device for defects

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12131957B2Oct 29, 2024

Manufacturing process with atomic level inspection

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11856793B2Dec 26, 2023

Memory array and method of forming thereof

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11761905B2Sep 19, 2023

Inspection layer to improve the detection of defects through optical systems and methods of inspecting semiconductor device for defects

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12424548B2Sep 23, 2025

Metallization layer and fabrication method

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations56
US12002755B2Jun 4, 2024

Metallization layer and fabrication method

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations56
US12218014B2Feb 4, 2025

Method for non-destructive inspection of cell etch redeposition

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50
US11894297B2Feb 6, 2024

Metal-insulator-metal capacitor having electrodes with increasing thickness

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50
US11862665B2Jan 2, 2024

Semiconductor structure including MIM capacitor and method of forming the same

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50
US11749569B2Sep 5, 2023

Method for non-destructive inspection of cell etch redeposition

TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50

INNOLUX CORP

3 patents