Inventor
LEE I-CHE
TW18 patents
⚠️ This page may combine multiple inventors who share the name “LEE I-CHE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
15 patentsUS12040018B2Jul 16, 2024
Method for programming memory
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US11527289B2Dec 13, 2022
Method for programming memory
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US11404477B2Aug 2, 2022
Memory array and method of forming thereof
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US12417806B2Sep 16, 2025
Method for programming memory
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12412787B2Sep 9, 2025
Manufacturing process with atomic level inspection
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12281991B2Apr 22, 2025
Inspection layer to improve the detection of defects through optical systems and methods of inspecting semiconductor device for defects
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12131957B2Oct 29, 2024
Manufacturing process with atomic level inspection
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11856793B2Dec 26, 2023
Memory array and method of forming thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11761905B2Sep 19, 2023
Inspection layer to improve the detection of defects through optical systems and methods of inspecting semiconductor device for defects
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12424548B2Sep 23, 2025
Metallization layer and fabrication method
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations56
US12002755B2Jun 4, 2024
Metallization layer and fabrication method
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations56
US12218014B2Feb 4, 2025
Method for non-destructive inspection of cell etch redeposition
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50
US11894297B2Feb 6, 2024
Metal-insulator-metal capacitor having electrodes with increasing thickness
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50
US11862665B2Jan 2, 2024
Semiconductor structure including MIM capacitor and method of forming the same
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50
US11749569B2Sep 5, 2023
Method for non-destructive inspection of cell etch redeposition
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50