P

Inventor

Pappu Lakshminarayana

US42 patents
⚠️ This page may combine multiple inventors who share the name “Pappu Lakshminarayana”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

INTEL CORP

41 patents
US9972611B2May 15, 2018

Stacked semiconductor package having fault detection and a method for identifying a fault in a stacked package

INTEL CORP27 citations90
US9995785B2Jun 12, 2018

Stacked semiconductor package and method for performing bare die testing on a functional die in a stacked semiconductor package

INTEL CORP10 citations82
US12561277B2Feb 24, 2026

Memory controller management techniques for managing data transfer for memory access operations

INTEL CORP0 citations73
US10739836B2Aug 11, 2020

System, apparatus and method for handshaking protocol for low power state transitions

INTEL CORP4 citations73
US10056155B2Aug 21, 2018

Systems, methods, and apparatuses for implementing testing of a far memory subsystem within two-level memory (2LM) stacked die subsystems

INTEL CORP3 citations73
US10732699B2Aug 4, 2020

Redundancy in distribution of voltage-frequency scaling parameters

INTEL CORP2 citations71
US10127162B2Nov 13, 2018

Efficient low cost on-die configurable bridge controller

INTEL CORP2 citations71
US10484361B2Nov 19, 2019

Systems, methods, and apparatuses for implementing a virtual device observation and debug network for high speed serial IOS

INTEL CORP2 citations70
US10249597B2Apr 2, 2019

Systems, methods, and apparatuses for implementing die recovery in two-level memory (2LM) stacked die subsystems

INTEL CORP3 citations69
US12461878B2Nov 4, 2025

System, method, apparatus and architecture for dynamically configuring device fabrics

INTEL CORP0 citations62
US12339728B2Jun 24, 2025

Dynamic voltage and frequency scaling for discrete graphics systems

INTEL CORP0 citations62
US11042315B2Jun 22, 2021

Dynamically programmable memory test traffic router

INTEL CORP0 citations62
US10901035B2Jan 26, 2021

Techniques in ensuring functional safety (fusa) systems

INTEL CORP0 citations62
US10613955B2Apr 7, 2020

Platform debug and testing with secured hardware

INTEL CORP1 citations62
US10204025B2Feb 12, 2019

Mechanism to provide back-to-back testing of memory controller operation

INTEL CORP1 citations62
US12117878B2Oct 15, 2024

Methods and apparatus to reduce display connection latency

INTEL CORP0 citations61
US10705142B2Jul 7, 2020

Device, system and method for providing on-chip test/debug functionality

INTEL CORP1 citations61
US11686767B2Jun 27, 2023

System, apparatus and method for functional testing of one or more fabrics of a processor

INTEL CORP0 citations59
US10664433B2May 26, 2020

Innovative high speed serial controller testing

INTEL CORP1 citations59
US10657092B2May 19, 2020

Innovative high speed serial controller testing

INTEL CORP1 citations59
US11231927B2Jan 25, 2022

System, apparatus and method for providing a fabric for an accelerator

INTEL CORP1 citations58
US12386760B2Aug 12, 2025

System-on-a-chip (SoC) architecture for low power state communication

INTEL CORP0 citations56
US11105854B2Aug 31, 2021

System, apparatus and method for inter-die functional testing of an integrated circuit

INTEL CORP0 citations56
US12536607B2Jan 27, 2026

Modular GPU architecture for clients and servers

INTEL CORP0 citations52
US12425678B2Sep 23, 2025

Low latency communication path for audio/visual (A/V) applications

INTEL CORP0 citations52
US12353313B2Jul 8, 2025

Infrastructure for platform immersive experience

INTEL CORP0 citations52
US10691249B2Jun 23, 2020

Touch host controller

INTEL CORP0 citations52
US10410560B2Sep 10, 2019

Display controller testing through high speed communications switch

INTEL CORP0 citations52
US10346265B2Jul 9, 2019

Protocol aware testing engine for high speed link integrity testing

INTEL CORP0 citations52
US10192633B2Jan 29, 2019

Low cost inbuilt deterministic tester for SOC testing

INTEL CORP0 citations51
US10725097B2Jul 28, 2020

Platform component interconnect testing

INTEL CORP0 citations50
US10379980B2Aug 13, 2019

Maintaining IO block operation in electronic systems for board testing

INTEL CORP0 citations50
US10319453B2Jun 11, 2019

Board level leakage testing for memory interface

INTEL CORP0 citations50
US10303237B2May 28, 2019

Phase lock loop bypass for board-level testing of systems

INTEL CORP0 citations50
US9891282B2Feb 13, 2018

Chip fabric interconnect quality on silicon

INTEL CORP0 citations49
US9971644B2May 15, 2018

Serial I/O functional tester

INTEL CORP0 citations48
US12418478B2Sep 16, 2025

Interconnect network for multi-tile system on chips

INTEL CORP0 citations47
US12373348B2Jul 29, 2025

Atomic handling for disaggregated 3D structured SoCs

INTEL CORP0 citations47
US10417170B2Sep 17, 2019

Device, system and method for packet processing to facilitate circuit testing

INTEL CORP0 citations45
US10430314B2Oct 1, 2019

Firmware fingerprinting based on data monitored during firmware loading

INTEL CORP0 citations44
US10185695B2Jan 22, 2019

Device, system and method for on-chip testing of protocol stack circuitry

INTEL CORP0 citations42

Pappu Lakshminarayana

1 patent