Inventor
Pappu Lakshminarayana
US42 patents
⚠️ This page may combine multiple inventors who share the name “Pappu Lakshminarayana”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INTEL CORP
41 patentsUS9972611B2May 15, 2018
Stacked semiconductor package having fault detection and a method for identifying a fault in a stacked package
INTEL CORP27 citations90
US9995785B2Jun 12, 2018
Stacked semiconductor package and method for performing bare die testing on a functional die in a stacked semiconductor package
INTEL CORP10 citations82
US12561277B2Feb 24, 2026
Memory controller management techniques for managing data transfer for memory access operations
INTEL CORP0 citations73
US10739836B2Aug 11, 2020
System, apparatus and method for handshaking protocol for low power state transitions
INTEL CORP4 citations73
US10056155B2Aug 21, 2018
Systems, methods, and apparatuses for implementing testing of a far memory subsystem within two-level memory (2LM) stacked die subsystems
INTEL CORP3 citations73
US10732699B2Aug 4, 2020
Redundancy in distribution of voltage-frequency scaling parameters
INTEL CORP2 citations71
US10127162B2Nov 13, 2018
Efficient low cost on-die configurable bridge controller
INTEL CORP2 citations71
US10484361B2Nov 19, 2019
Systems, methods, and apparatuses for implementing a virtual device observation and debug network for high speed serial IOS
INTEL CORP2 citations70
US10249597B2Apr 2, 2019
Systems, methods, and apparatuses for implementing die recovery in two-level memory (2LM) stacked die subsystems
INTEL CORP3 citations69
US12461878B2Nov 4, 2025
System, method, apparatus and architecture for dynamically configuring device fabrics
INTEL CORP0 citations62
US12339728B2Jun 24, 2025
Dynamic voltage and frequency scaling for discrete graphics systems
INTEL CORP0 citations62
US11042315B2Jun 22, 2021
Dynamically programmable memory test traffic router
INTEL CORP0 citations62
US10901035B2Jan 26, 2021
Techniques in ensuring functional safety (fusa) systems
INTEL CORP0 citations62
US10613955B2Apr 7, 2020
Platform debug and testing with secured hardware
INTEL CORP1 citations62
US10204025B2Feb 12, 2019
Mechanism to provide back-to-back testing of memory controller operation
INTEL CORP1 citations62
US12117878B2Oct 15, 2024
Methods and apparatus to reduce display connection latency
INTEL CORP0 citations61
US10705142B2Jul 7, 2020
Device, system and method for providing on-chip test/debug functionality
INTEL CORP1 citations61
US11686767B2Jun 27, 2023
System, apparatus and method for functional testing of one or more fabrics of a processor
INTEL CORP0 citations59
US10664433B2May 26, 2020
Innovative high speed serial controller testing
INTEL CORP1 citations59
US10657092B2May 19, 2020
Innovative high speed serial controller testing
INTEL CORP1 citations59
US11231927B2Jan 25, 2022
System, apparatus and method for providing a fabric for an accelerator
INTEL CORP1 citations58
US12386760B2Aug 12, 2025
System-on-a-chip (SoC) architecture for low power state communication
INTEL CORP0 citations56
US11105854B2Aug 31, 2021
System, apparatus and method for inter-die functional testing of an integrated circuit
INTEL CORP0 citations56
US12536607B2Jan 27, 2026
Modular GPU architecture for clients and servers
INTEL CORP0 citations52
US12425678B2Sep 23, 2025
Low latency communication path for audio/visual (A/V) applications
INTEL CORP0 citations52
US12353313B2Jul 8, 2025
Infrastructure for platform immersive experience
INTEL CORP0 citations52
US10691249B2Jun 23, 2020
Touch host controller
INTEL CORP0 citations52
US10410560B2Sep 10, 2019
Display controller testing through high speed communications switch
INTEL CORP0 citations52
US10346265B2Jul 9, 2019
Protocol aware testing engine for high speed link integrity testing
INTEL CORP0 citations52
US10192633B2Jan 29, 2019
Low cost inbuilt deterministic tester for SOC testing
INTEL CORP0 citations51
US10725097B2Jul 28, 2020
Platform component interconnect testing
INTEL CORP0 citations50
US10379980B2Aug 13, 2019
Maintaining IO block operation in electronic systems for board testing
INTEL CORP0 citations50
US10319453B2Jun 11, 2019
Board level leakage testing for memory interface
INTEL CORP0 citations50
US10303237B2May 28, 2019
Phase lock loop bypass for board-level testing of systems
INTEL CORP0 citations50
US9891282B2Feb 13, 2018
Chip fabric interconnect quality on silicon
INTEL CORP0 citations49
US9971644B2May 15, 2018
Serial I/O functional tester
INTEL CORP0 citations48
US12418478B2Sep 16, 2025
Interconnect network for multi-tile system on chips
INTEL CORP0 citations47
US12373348B2Jul 29, 2025
Atomic handling for disaggregated 3D structured SoCs
INTEL CORP0 citations47
US10417170B2Sep 17, 2019
Device, system and method for packet processing to facilitate circuit testing
INTEL CORP0 citations45
US10430314B2Oct 1, 2019
Firmware fingerprinting based on data monitored during firmware loading
INTEL CORP0 citations44
US10185695B2Jan 22, 2019
Device, system and method for on-chip testing of protocol stack circuitry
INTEL CORP0 citations42