Inventor
MAHATME NIHAAR N
US22 patents
⚠️ This page may combine multiple inventors who share the name “MAHATME NIHAAR N”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NXP USA INC
21 patentsUS9947391B1Apr 17, 2018
SRAM based physically unclonable function and method for generating a PUF response
NXP USA INC53 citations93
US10529400B1Jan 7, 2020
Magnetic attack detection in a magnetic random access memory (MRAM)
NXP USA INC13 citations85
US10574469B1Feb 25, 2020
Physically unclonable function and method for generating a digital code
NXP USA INC17 citations83
US11233663B1Jan 25, 2022
Physically unclonable function having source bias transistors
NXP USA INC11 citations82
US10699764B1Jun 30, 2020
MRAM memory with OTP cells
NXP USA INC6 citations73
US10734047B1Aug 4, 2020
SRAM based physically unclonable function and method for generating a PUF response
NXP USA INC2 citations72
US11056161B2Jul 6, 2021
Data processing system and method for generating a digital code with a physically unclonable function
NXP USA INC3 citations70
US12531103B2Jan 20, 2026
Management of refresh operations in an embedded dynamic random access memories (DRAMs) having canary cells
NXP USA INC0 citations62
US11755411B2Sep 12, 2023
Error rate reduction in a non-volatile memory (NVM), including magneto-resistive random access memories (MRAMS)
NXP USA INC1 citations62
US11379307B2Jul 5, 2022
Error rate reduction in a non-volatile memory (NVM), including magneto-resistive random access memories (MRAMs)
NXP USA INC0 citations62
US11222679B2Jan 11, 2022
Packaged integrated circuit having a photodiode and a resistive memory
NXP USA INC0 citations62
US10921390B2Feb 16, 2021
Magnetic attack detection in a magnetic random access memory (MRAM)
NXP USA INC0 citations62
US12406716B2Sep 2, 2025
Refresh operations in embedded dynamic random access memories (DRAMs)
NXP USA INC0 citations61
US11277271B2Mar 15, 2022
SRAM based physically unclonable function and method for generating a PUF response
NXP USA INC1 citations59
US12224024B2Feb 11, 2025
Memory with one-time programmable (OTP) cells
NXP USA INC0 citations52
US12001674B2Jun 4, 2024
Reusing memory arrays for physically unclonable function (PUF) generation
NXP USA INC0 citations52
US11164648B2Nov 2, 2021
Glitch profiling in an integrated circuit
NXP USA INC0 citations51
US10446225B1Oct 15, 2019
Memory system having a source bias circuit
NXP USA INC0 citations51
US12094510B2Sep 17, 2024
Magnetoresistive random access memory (MRAM) with end of life margin sensor
NXP USA INC0 citations46
US11908784B2Feb 20, 2024
Packaged semiconductor device assembly
NXP USA INC0 citations46
US10978123B2Apr 13, 2021
Tamper protection of memory devices on an integrated circuit
NXP USA INC0 citations45