P

Inventor

MAHATME NIHAAR N

US22 patents
⚠️ This page may combine multiple inventors who share the name “MAHATME NIHAAR N”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NXP USA INC

21 patents
US9947391B1Apr 17, 2018

SRAM based physically unclonable function and method for generating a PUF response

NXP USA INC53 citations93
US10529400B1Jan 7, 2020

Magnetic attack detection in a magnetic random access memory (MRAM)

NXP USA INC13 citations85
US10574469B1Feb 25, 2020

Physically unclonable function and method for generating a digital code

NXP USA INC17 citations83
US11233663B1Jan 25, 2022

Physically unclonable function having source bias transistors

NXP USA INC11 citations82
US10699764B1Jun 30, 2020

MRAM memory with OTP cells

NXP USA INC6 citations73
US10734047B1Aug 4, 2020

SRAM based physically unclonable function and method for generating a PUF response

NXP USA INC2 citations72
US11056161B2Jul 6, 2021

Data processing system and method for generating a digital code with a physically unclonable function

NXP USA INC3 citations70
US12531103B2Jan 20, 2026

Management of refresh operations in an embedded dynamic random access memories (DRAMs) having canary cells

NXP USA INC0 citations62
US11755411B2Sep 12, 2023

Error rate reduction in a non-volatile memory (NVM), including magneto-resistive random access memories (MRAMS)

NXP USA INC1 citations62
US11379307B2Jul 5, 2022

Error rate reduction in a non-volatile memory (NVM), including magneto-resistive random access memories (MRAMs)

NXP USA INC0 citations62
US11222679B2Jan 11, 2022

Packaged integrated circuit having a photodiode and a resistive memory

NXP USA INC0 citations62
US10921390B2Feb 16, 2021

Magnetic attack detection in a magnetic random access memory (MRAM)

NXP USA INC0 citations62
US12406716B2Sep 2, 2025

Refresh operations in embedded dynamic random access memories (DRAMs)

NXP USA INC0 citations61
US11277271B2Mar 15, 2022

SRAM based physically unclonable function and method for generating a PUF response

NXP USA INC1 citations59
US12224024B2Feb 11, 2025

Memory with one-time programmable (OTP) cells

NXP USA INC0 citations52
US12001674B2Jun 4, 2024

Reusing memory arrays for physically unclonable function (PUF) generation

NXP USA INC0 citations52
US11164648B2Nov 2, 2021

Glitch profiling in an integrated circuit

NXP USA INC0 citations51
US10446225B1Oct 15, 2019

Memory system having a source bias circuit

NXP USA INC0 citations51
US12094510B2Sep 17, 2024

Magnetoresistive random access memory (MRAM) with end of life margin sensor

NXP USA INC0 citations46
US11908784B2Feb 20, 2024

Packaged semiconductor device assembly

NXP USA INC0 citations46
US10978123B2Apr 13, 2021

Tamper protection of memory devices on an integrated circuit

NXP USA INC0 citations45

FREESCALE SEMICONDUCTOR INC

1 patent